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4 October 2023 Pulse-to-pulse field characterization at x-ray free-electron lasers using a speckle-correlation scattering matrix
KyeoReh Lee, Jun Lim, YongKeun Park
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Proceedings Volume PC12695, Advances in Metrology for X-Ray and EUV Optics X; PC1269508 (2023) https://doi.org/10.1117/12.2676300
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States
Abstract
We present a single-shot pulse diagnostic system for X-ray free-electron lasers (XFELs) using a speckle-correlation scattering matrix (SSM). Characterization of pulse shapes is crucial for the wide range of applications in XFELs. However, single-shot field characterization in XFELs has remained challenging due to the stochastic nature of self-amplified stimulated emission. Our method demonstrates robust field retrieval performance regardless of the incident field properties. We have proven the robustness of the method by successfully reconstructing fields in various experimental configurations.
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KyeoReh Lee, Jun Lim, and YongKeun Park "Pulse-to-pulse field characterization at x-ray free-electron lasers using a speckle-correlation scattering matrix", Proc. SPIE PC12695, Advances in Metrology for X-Ray and EUV Optics X, PC1269508 (4 October 2023); https://doi.org/10.1117/12.2676300
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KEYWORDS
Free electron lasers
Matrices
X-ray lasers
X-rays
Laser scattering
X-ray characterization
Diffraction
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