Aberration corrected reflection tomography for ultra-high resolution and versatile reflection measurement

Herve J. Hugonnet; Park YongKeun

doi:10.1117/12.3001232

13 March 2024 Aberration corrected reflection tomography for ultra-high resolution and versatile reflection measurement

Herve J. Hugonnet, Park YongKeun

Proceedings Volume PC12852, Quantitative Phase Imaging X; PC1285209 (2024) https://doi.org/10.1117/12.3001232
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

We propose a novel approach for reflective measurements using utilizes high temporal coherence and low spatial coherence illumination in a full-field reflective geometry. This allows the reference plane to be shifted to the camera, eliminating the need for meticulous alignment and enabling the use of a single high numerical aperture (NA) objective lens. To enhance the quality of our measurements, we perform deconvolution and digital aberration correction on the measured data. We achieve a resolution close to the theoretical limit of our system: 100nm-100nm-500nm and demonstrate the unique capabilities of our experimental setup on both biological and industrial samples.

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Herve J. Hugonnet and Park YongKeun "Aberration corrected reflection tomography for ultra-high resolution and versatile reflection measurement", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC1285209 (13 March 2024); https://doi.org/10.1117/12.3001232

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KEYWORDS

Biological samples

Reflection

Ultrasound reflection tomography

Light sources and illumination

Data modeling

Polarization

Signal to noise ratio

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