Single-photon avalanche diode (SPAD) arrays have surpassed other detector technologies ; photon-multiplying tubes (PMTs) in signal-noise ratio (SNR) and electron multiplied charge coupled devices (EMCCDs) in frame rate andphoton fidelity, and have proven beneficial for advanced microscopy applications. Resolution and SNR improvements have been demonstrated in image scanning microscopy (ISM) and quantum image scanning microscopy (qISM) . Despite SPAD arrays reaching near 100% fill factor thanks to optimized micro lense design and fabrication processes, the photon detection efficiency (PDE) remains limited in the red and near-IR wavelengths. In this work, we present a 23-channels SPAD array with low dark count rate (DCR), picosecond time tagging capabilities and improved sensitivity for wavelength from 600 to 1000 nm. The fabrication process is fully CMOS compatible and easily scalable to larger arrays. We show a PDE of 60% and 15% at 620 nm and 900 nm, respectively. Despite the increased spectral response, the SPAD array keeps a very low ambient temperature DCR of less than 100 counts per second.
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