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11 June 2024 Metasurface-enabled compact and fast polarimeter
Chao Meng, Paul Thrane, Christopher Dirdal, Oleksii Sieryi, Alexander Bykov, Igor Meglinski, Sergey I. Bozhevolnyi
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Proceedings Volume PC12990, Metamaterials XIV; PC129900Z (2024) https://doi.org/10.1117/12.3017485
Event: SPIE Photonics Europe, 2024, Strasbourg, France
Abstract
Polarization analysis is essential in fields like engineering and biomedical research. Traditional polarimeters use a quarter-wave plate and a linear polarizer but are slow because they rely on mechanically rotating parts. Our team has developed a metasurface-based polarimeter that measures polarization quickly in one shot, without moving parts, using visible light at 640 nm. It combines optical, mechanical, and electrical elements and is precisely calibrated for accuracy. Accompanied by advanced software, it controls operational parameters and captures detailed data. Currently, it matches the speed of existing polarimeters using a CMOS camera for detection. Future upgrades with a fast photodetector array are expected to increase measurement speeds. Our device has been tested against standard polarimeters and can measure both fully and partially polarized light effectively. This new polarimeter is set to change applications needing high-speed, compact polarization analysis tools, offering a leap in rapid and efficient measurement capabilities.
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Chao Meng, Paul Thrane, Christopher Dirdal, Oleksii Sieryi, Alexander Bykov, Igor Meglinski, and Sergey I. Bozhevolnyi "Metasurface-enabled compact and fast polarimeter", Proc. SPIE PC12990, Metamaterials XIV, PC129900Z (11 June 2024); https://doi.org/10.1117/12.3017485
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KEYWORDS
Polarimetry
Calibration
Industrial applications
Photodetectors
Polarization
Polarization analysis
Prototyping
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