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11 June 2024 Visible and near-infrared nanoscale spectroscopy with photoinduced force microscopy
Stefano Chiodini, Andrea Mancini, Antonio Ambrosio
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Proceedings Volume PC12991, Nanophotonics X; PC129910T (2024) https://doi.org/10.1117/12.3016794
Event: SPIE Photonics Europe, 2024, Strasbourg, France
Abstract
Photo-induced Force Microscopy (PiFM) offers a promising alternative to traditional scanning near-field optical microscopy for subwavelength imaging. PiFM's key advantage is its fully mechanical detection through the Atomic Force Microscope (AFM) cantilever, simplifying the setup by eliminating the need for optical detectors and complex interferometric techniques. However, PiFM typically requires laser modulation at the AFM cantilever's intrinsic frequency, which can be challenging in the visible and near-infrared ranges, often involving Acousto-Optic Modulators (AOMs) that introduce a wavelength-dependent laser steering. Our innovative setup eliminates the need for realignment, making PiFM a valuable tool for near-field spectroscopy in the visible and near-infrared spectral ranges.
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Stefano Chiodini, Andrea Mancini, and Antonio Ambrosio "Visible and near-infrared nanoscale spectroscopy with photoinduced force microscopy", Proc. SPIE PC12991, Nanophotonics X, PC129910T (11 June 2024); https://doi.org/10.1117/12.3016794
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KEYWORDS
Spectroscopy
Optical microscopy
Visible radiation
Near infrared spectroscopy
Atomic force microscopy
Bragg cells
Near field scanning optical microscopy
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