Presentation
19 June 2024 Using and measuring excitons for novel organic optoelectronic technologies
Katelyn P. Goetz, Adam J. Biacchi, Chad D. Cruz, Sebastian Engmann, Curt A. Richter, Chad R. Snyder, Emily G. Bittle
Author Affiliations +
Abstract
The use of singlet fission to enhance device efficiency or enable new capabilities raises the need to investigate it on a slow operational timescale. Using a transistor-based measurement to examine temperature-dependent singlet fission in tetracene single crystals, we observe that it is activated to 210 K, at which point it undergoes an optoelectronic phase transition. We compare these results to those of pentacene and suggest that the phase change is due to a change in the singlet fission kinetics. We further examine the interplay between this readout and other extrinsic and intrinsic device properties, such as disorder and trap states. Our results give insight not only into the readout mechanism of this OFET-based measurement, but also strategies to manipulate and tune the response.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katelyn P. Goetz, Adam J. Biacchi, Chad D. Cruz, Sebastian Engmann, Curt A. Richter, Chad R. Snyder, and Emily G. Bittle "Using and measuring excitons for novel organic optoelectronic technologies", Proc. SPIE PC13013, Organic Electronics and Photonics: Fundamentals and Devices IV, PC1301308 (19 June 2024); https://doi.org/10.1117/12.3022538
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KEYWORDS
Quantum reading

Transistors

Excitons

Field effect transistors

Materials properties

Quantum devices

Quantum measurement

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