28 March 2022 Near-duplicate image detection based on wavelet decomposition with modified deep learning model
Preeti Mehta, Mahesh K. Singh, Nitin Singha
Author Affiliations +
Abstract

We aim to address the near-duplicate image (NDI) detection problem with a deep learning network. With the advancement of digital acquisition devices and easy-to-use image editing software, NDI forgery is ubiquitous nowadays. This rising problem demands robust detection algorithms that can efficiently prevent the NDI forgery and its distribution. We present a modified deep learning model to detect NDI forensics attacks based on extracted wavelet Haar features. Unlike standard deep learning models, a wavelet decomposed preprocessing layer is used before the deep learning networks, and a support vector machine classifier is employed in the classification stage of a modified deep learning model. The model is tested on distinctly available image databases. The experimental results show that the proposed model more effectively detect the NDIs. In addition, the comparison result shows that the modified model outperforms the other approaches significantly.

© 2022 SPIE and IS&T 1017-9909/2022/$28.00 © 2022 SPIE and IS&T
Preeti Mehta, Mahesh K. Singh, and Nitin Singha "Near-duplicate image detection based on wavelet decomposition with modified deep learning model," Journal of Electronic Imaging 31(2), 023017 (28 March 2022). https://doi.org/10.1117/1.JEI.31.2.023017
Received: 4 September 2021; Accepted: 2 March 2022; Published: 28 March 2022
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Wavelets

LCDs

Image processing

Feature extraction

Digital imaging

RGB color model

Cameras

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