Effects of resist sidewall morphology on line-edge roughness reduction and transfer during etching: is the resist sidewall after development isotropic or anisotropic?

Vassilios Constantoudis; George Kokkoris; Evangelos Gogolides; Erwine Pargon; M. Martin

doi:10.1117/1.3497601

1 November 2010 Effects of resist sidewall morphology on line-edge roughness reduction and transfer during etching: is the resist sidewall after development isotropic or anisotropic?

Vassilios Constantoudis, George Kokkoris, Evangelos Gogolides, Erwine Pargon, M. Martin

Author Affiliations +

Journal of Micro/Nanolithography, MEMS, and MOEMS, Vol. 9, Issue 4, 041209 (November 2010). https://doi.org/10.1117/1.3497601

Abstract

Measurements of the sidewall morphology of commercial resist lines (3-D line-edge roughness) after lithography and before etching by critical dimension atomic force microscopy (CD-AFM) and scanning electron microscopy show that they exhibit anisotropy in the form of striations perpendicular to line direction. When this anisotropy of postlithography resist sidewalls is included in the models for trimming and pattern transfer proposed in an earlier paper [Constantoudis et al., J. Micro/Nanolith. MEMS MOEMS 8(4), 043004 (2009)], the models predict the beneficial role of trimming process in line-edge roughness reduction during pattern transfer, in agreement with experimental results. Furthermore, experimental and simulation studies show that the CD-AFM measurements of the 3-D line width roughness may overestimate the correlation length. Taking into account this finding in the model for trimming, we find that model predictions further approach the experimental results.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Vassilios Constantoudis, George Kokkoris, Evangelos Gogolides, Erwine Pargon, and M. Martin "Effects of resist sidewall morphology on line-edge roughness reduction and transfer during etching: is the resist sidewall after development isotropic or anisotropic?," Journal of Micro/Nanolithography, MEMS, and MOEMS 9(4), 041209 (1 November 2010). https://doi.org/10.1117/1.3497601

Published: 1 November 2010

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE