Long-Distance Electronic Speckle Pattern Interferometry

Ole J. Lokberg; Jan T. Malmo

doi:10.1117/12.7976660

1 February 1988 Long-Distance Electronic Speckle Pattern Interferometry

Ole J. Lokberg, Jan T. Malmo

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Optical Engineering, Vol. 27, Issue 2, 272150 (February 1988). https://doi.org/10.1117/12.7976660

Abstract

Electronic speckle pattern interferometry has been used to measure the vibrations and deformations of objects located far from the optical head. Vibration recordings were made for a total path-length difference of up to 200 m with the object outdoors in bright sunshine. This limit was determined by practical considerations. For deformation recordings, turbulence and mechanical instabilities create a problem, and a more realistic limit is a path-length difference of about 50 m under stable, indoor conditions.

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Ole J. Lokberg and Jan T. Malmo "Long-Distance Electronic Speckle Pattern Interferometry," Optical Engineering 27(2), 272150 (1 February 1988). https://doi.org/10.1117/12.7976660

Published: 1 February 1988

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