10 December 2012 Direct comparision of the damage frequency method and binary search technique
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Abstract
We present a direct comparison of two techniques for the determination of laser damage threshold. The two techniques are compared for their accuracy and repeatability and analyzed to understand the intrinsic biases of each test. We show that the damage frequency method underestimates the true value and has poor repeatability and the binary search method over-estimates the threshold, but is the more repeatable method.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
Jonathan W. Arenberg "Direct comparision of the damage frequency method and binary search technique," Optical Engineering 51(12), 121819 (10 December 2012). https://doi.org/10.1117/1.OE.51.12.121819
Published: 10 December 2012
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Binary data

Design for manufacturing

Monte Carlo methods

Laser damage threshold

Optical engineering

Data modeling

Laser induced damage

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