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9 February 2015 Specification of x-ray mirrors in terms of system performance: new twist to an old plot
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Abstract
In the early 1990s, Church and Takacs pointed out that the specification of surface figure and finish of x-ray mirrors must be based on their performance in the beamline optical system. We demonstrate the limitations of specification, characterization, and performance evaluation based on conventional statistical approaches, including root-mean-square roughness and residual slope variation, evaluated over spatial frequency bandwidths that are system specific, and a more refined description of the surface morphology based on the power spectral density distribution. We show that these limitations are fatal, especially in the case of highly collimated coherent x-ray beams, like beams from x-ray free electron lasers (XFELs). The limitations arise due to the deterministic character of the surface profile data for a definite mirror, while the specific correlation properties of the surface are essential for the performance of the entire x-ray optical system. As a possible way to overcome the problem, we treat a method, suggested by Yashchuk and Yashchuk in 2012, based on an autoregressive moving average modeling of the slope measurements with a limited number of parameters. The effectiveness of the approach is demonstrated with an example specific to the x-ray optical systems under design at the European XFEL.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Valeriy V. Yashchuk, Liubov V. Samoylova, and Igor V. Kozhevnikov "Specification of x-ray mirrors in terms of system performance: new twist to an old plot," Optical Engineering 54(2), 025108 (9 February 2015). https://doi.org/10.1117/1.OE.54.2.025108
Published: 9 February 2015
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CITATIONS
Cited by 29 scholarly publications.
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KEYWORDS
Mirrors

X-rays

X-ray optics

Spatial frequencies

Scattering

Surface finishing

Error analysis

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