31 May 2019 Measuring cone angle of axicon using scanning Fizeau interferometer
Yan Yan, Feng Tang, Xiangzhao Wang, Yunjun Lu, Fudong Guo
Author Affiliations +
Abstract
We propose a noncontact method for measuring the cone angle of an axicon. A microscanning stage moves the axicon being tested while a Fizeau interferometer is recording the scanning interferograms. The cone angle is measured accurately with the axial moving distance and the phase change calculated from interference fringe counting. Numerical analysis discusses the influence of standard deviation of the interference fringe count and the standard deviation of the scanning distance. Three methods for systematic error calibration are also proposed. This approach can measure both concave and convex axicons with a cone angle in the range of 96.4 deg to 170 deg. The measurable diameter of the axicon exceeds 100 mm. The spatial distribution of cone angle can be obtained with a resolution from 300  μm to 1 mm. The theoretical measurement accuracy is better than 10″ when the scanning distance is 1000  μm, and the positioning error is <10  nm. Experiments have been carried out to prove the feasibility of the proposed method, a 140-deg convex axicon is measured, and the measurement repeatability is ∼6  ″  .
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$25.00 © 2019 SPIE
Yan Yan, Feng Tang, Xiangzhao Wang, Yunjun Lu, and Fudong Guo "Measuring cone angle of axicon using scanning Fizeau interferometer," Optical Engineering 58(5), 054107 (31 May 2019). https://doi.org/10.1117/1.OE.58.5.054107
Received: 19 February 2019; Accepted: 15 May 2019; Published: 31 May 2019
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Axicons

Interferometers

Fizeau interferometers

Calibration

Error analysis

Distance measurement

Optical engineering

Back to Top