Calibration method for dual-tilt-axis tool based on image thresholding of skew tool influence function

Yunpeng Feng; Haobo Cheng

doi:10.1117/1.OE.58.9.092606

24 April 2019 Calibration method for dual-tilt-axis tool based on image thresholding of skew tool influence function

Yunpeng Feng, Haobo Cheng

Author Affiliations +

Funded by: Science and Technology Innovation Foundation of Shenzhen

Optical Engineering, Vol. 58, Issue 9, 092606 (April 2019). https://doi.org/10.1117/1.OE.58.9.092606

Abstract

Modern subaperture technologies mostly use the five-axis machine to follow the normal of state-of-the-art surfaces, such as aspheric, off-axis surfaces. The dual-tilt-axis tool has been widely used in optical manufacture to change the orientation of the tool. The initial tilt positions of the tool play an important role in the symmetry of tool influence function (TIF). The tilt angle errors may cause a skew TIF. We discussed the self-developed machine and its TIF models with different motion modes. Next, the effect of tilt angle errors, include spinning axis tilt error and revolution axis tilt error, was analyzed based on our self-developed polishing machine. Symmetric TIF will distort and form a skew TIF due to the angle error. There was a linear relationship between the eccentric ratio of the skew TIF and the angle error. In the experimental study, an initial adjustment was performed by utilizing a dial gauge, and then the TIF result showed that there were still some angle errors. We presented an image thresholding calibration method based on skew TIF to solve the tilt angle errors. After the new calibration, the following compared experiment got a fine symmetric, and Gauss-like TIF, and proved the validity of the proposed model and calibration method.

Citation Download Citation

Yunpeng Feng and Haobo Cheng "Calibration method for dual-tilt-axis tool based on image thresholding of skew tool influence function," Optical Engineering 58(9), 092606 (24 April 2019). https://doi.org/10.1117/1.OE.58.9.092606

Received: 31 December 2018; Accepted: 27 March 2019; Published: 24 April 2019

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE