Microwave chips dependent devices constitute the cornerstone of many classical and emerging quantum technologies. To meet the demand for high-resolution, lossless, and fast wide-field imaging of microwave devices, we propose a wide-field microwave imaging method based on diamond nitrogen-vacancy center ensembles by combining continuous wave optically detected magnetic resonance technology with optical wide-field imaging technology. First, the optimal selection of laser parameters is achieved by measuring different laser powers. Then the accuracy of the wide-field microwave imaging technique is demonstrated by measuring the near-field imaging of the antenna surface at different microwave input powers and different microwave input frequencies. The spatial resolution of the imaging system is 5 μm over a field of view of 2400 μm × 1350 μm, and the optimal microwave precision measurement sensitivity is 5.6 μT / Hz^1/2. The above results are expected to provide a practical reference for applications such as fault diagnosis of highly integrated microwave circuits, antenna radiation profiling, and electro magnetic compatibility testing of integrated microwave circuits.