Ahmed Saeed
at Si-Ware Systems
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10931, 109310Z (2019) https://doi.org/10.1117/12.2509378
KEYWORDS: Spectroscopy, Microelectromechanical systems, FT-IR spectroscopy, Sensors, Signal to noise ratio, Calibration, Absorption, Interferometers, Infrared spectroscopy, Silicon

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10931, 1093109 (2019) https://doi.org/10.1117/12.2508239
KEYWORDS: Spectroscopy, Microelectromechanical systems, FT-IR spectroscopy, Signal to noise ratio, Gases, Absorption, Liquids, Absorbance, Air contamination, Carbon monoxide

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