Dr. Angela D. Allen Profile

Dr. Angela D. Allen

Professor at Univ of North Carolina at Charlotte

SPIE Involvement:

Author | Editor

Publications (36)

Proceedings Article | 3 September 2019 Presentation + Paper

Evaluation of the spatial frequency response and the uncertainty for a commercial structured light system

Swati Jain, Angela Davies Allen, Bin Zhang

Proceedings Volume 11102, 111020X (2019) https://doi.org/10.1117/12.2528291

KEYWORDS: Modulation transfer functions, Cameras, Spatial frequencies, Structured light, Spatial resolution, Fourier transforms, 3D scanning, Scanners, Clouds, Point spread functions

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Proceedings Article | 18 August 2018 Presentation + Paper

Characterization of the interpolation bias in the analysis of deflectometry measurement data

Ali Pouya Fard, Angela Davies

Proceedings Volume 10749, 107490G (2018) https://doi.org/10.1117/12.2323420

KEYWORDS: Deflectometry, Phase measurement, Error analysis

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Proceedings Article | 23 August 2017 Presentation + Paper

Phase measuring deflectometry for determining 5 DOF misalignment of segmented mirrors

Angela Davies, Trent Vann, Christopher Evans, Mark Butkiewicz

Proceedings Volume 10373, 103730H (2017) https://doi.org/10.1117/12.2276947

KEYWORDS: Deflectometry, Segmented mirrors, Mirrors, Cameras, Optical alignment, Metrology, Telescopes, Interferometry, Fringe analysis, Moire patterns

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Proceedings Article | 23 August 2017 Presentation + Paper

Usefulness of orthogonal basis sets for predicting optical performance of wavefronts with mid-spatial frequency error

Zahra Hosseinimakarem, Angela Davies, Chris Evans

Proceedings Volume 10373, 1037302 (2017) https://doi.org/10.1117/12.2275831

KEYWORDS: Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics, Optical components, Optical design, Scattering

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Proceedings Article | 23 August 2017 Presentation + Paper

Application of instrument transfer function to a fringe projection system for measuring rough surfaces

Bin Zhang, Angela Davies, John Ziegert, Christopher Evans

Proceedings Volume 10373, 103730S (2017) https://doi.org/10.1117/12.2275892

KEYWORDS: Additive manufacturing, Projection systems, Metrology, Metals, Laser manufacturing, Laser welding, Inspection, Interferometry, In situ metrology

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Proceedings Article | 26 September 2016 Paper

Zernike polynomials for mid-spatial frequency representation on optical surfaces

Zahra Hosseinimakarem, Angela Davies, Chris Evans

Proceedings Volume 9961, 99610P (2016) https://doi.org/10.1117/12.2236520

KEYWORDS: Zernike polynomials, Fabrication, Freeform optics, Received signal strength, Raster graphics, Optical spheres, Germanium, Polishing, Spatial frequencies, Superposition

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Proceedings Article | 23 September 2014 Paper

An optical positioning sensor by combining optical projection and a virtual camera model

Benrui Zheng, Yue Dong, Brigid Mullany, Edward Morse, Angela Davies

Proceedings Volume 9223, 92230J (2014) https://doi.org/10.1117/12.2065523

KEYWORDS: Cameras, Sensors, Monte Carlo methods, Optical sensors, Distance measurement, Coded apertures, Image processing, Image sensors, Photogrammetry, Calibration

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Proceedings Article | 18 August 2014 Paper

Spurious mid-spatial frequency structure on optical surfaces reconstructed from surface slope measurements

Yue Dong, Zahra Hosseinimakarem, Angela Davies, Chris Evans

Proceedings Volume 9203, 92030G (2014) https://doi.org/10.1117/12.2061247

KEYWORDS: Reconstruction algorithms, Spatial frequencies, Surface finishing, Metrology, Freeform optics, Wavefronts, Error analysis, Polishing, Image quality, Adaptive optics

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SPIE Journal Paper | 7 May 2014

Using a three-dimensional optical simulation to investigate uncertainty in image-based dimensional measurements

Yue Dong, Thomas Hutchens, Brigid Mullany, Edward Morse, Angela Davies

OE, Vol. 53, Issue 09, 092007, (May 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.9.092007

KEYWORDS: Photogrammetry, Cameras, Optical simulations, Photography, Calibration, Virtual reality, Device simulation, 3D modeling, Ray tracing, Error analysis

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Proceedings Article | 13 September 2012 Paper

Comparison of the area structure function to alternate approaches for optical surface characterization

Liangyu He, Angela Davies, Chris Evans

Proceedings Volume 8493, 84930C (2012) https://doi.org/10.1117/12.929166

KEYWORDS: Spatial frequencies, Anisotropy, Surface finishing, Metrology, Visualization, Image processing, Mechanical engineering, Astronomy, Surface roughness, Optics manufacturing

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Proceedings Article | 13 September 2012 Paper

Self calibration for slope-dependent errors in optical profilometry by using the random ball test

Yue Zhou, Young-Sik Ghim, Angela Davies

Proceedings Volume 8493, 84930H (2012) https://doi.org/10.1117/12.928504

KEYWORDS: Calibration, Optical spheres, Confocal microscopy, Spherical lenses, Error analysis, Microscopes, Profilometers, Interferometers, Metrology, Interferometry

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Proceedings Article | 14 September 2011 Paper

Absolute thickness measurement of silicon wafer using wavelength scanning interferometer

Young-Sik Ghim, Amit Suratkar, Angela Davies, Yun-Woo Lee

Proceedings Volume 8133, 813312 (2011) https://doi.org/10.1117/12.898354

KEYWORDS: Semiconducting wafers, Interferometry, Silicon, Wafer-level optics, Charge-coupled devices, Reflectivity, Interferometers, Reflectometry, Refractive index, Error analysis

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Proceedings Article | 3 August 2010 Paper

Image continuity at different levels of zoom for Moiré techniques

Mehrdad Abolbashari, Awad Gerges, Angela Davies, Faramarz Farahi

Proceedings Volume 7790, 77900S (2010) https://doi.org/10.1117/12.860283

KEYWORDS: Zoom lenses, Image registration, Cameras, Interferometers, Imaging systems, Medical imaging, Signal to noise ratio, Stereoscopy, Range imaging, Image resolution

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Proceedings Article | 11 August 2008 Paper

Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer

Amit Suratkar, Young-Sik Ghim, Angela Davies

Proceedings Volume 7063, 70630R (2008) https://doi.org/10.1117/12.793772

KEYWORDS: Fourier transforms, Calibration, Interferometers, Silica, Interferometry, Error analysis, Temperature metrology, Uncertainty analysis, Distance measurement, Refractive index

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Proceedings Article | 14 September 2007 Paper

New interferometric technique to measure the length (thickness) of opaque objects using a commercial interferometer

Amit Suratkar, Angela Davies, Faramarz Farahi

Proceedings Volume 6671, 66710N (2007) https://doi.org/10.1117/12.733934

KEYWORDS: Interferometry, Opacity, Mirrors, Refractive index, Interferometers, Phase interferometry, Fringe analysis, Neodymium, Light sources, Distance measurement

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Proceedings Article | 14 August 2006 Paper

Ray-trace simulation of the random ball test to improve microlens metrology

Neil Gardner, Angela Davies

Proceedings Volume 6292, 629204 (2006) https://doi.org/10.1117/12.681421

KEYWORDS: Interferometers, Calibration, Optical spheres, Wavefronts, Zemax, MATLAB, Spherical lenses, Interferometry, Micro optics, Microlens

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SPIE Journal Paper | 1 March 2006

Self-calibration for microrefractive lens measurements

Neil Gardner, Angela Davies

OE, Vol. 45, Issue 03, 033603, (March 2006) https://doi.org/10.1117/12.10.1117/1.2181982

KEYWORDS: Calibration, Optical spheres, Interferometers, Error analysis, Optical engineering, Interferometry, Wavefronts, Monochromatic aberrations, Photovoltaics, Spherical lenses

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Proceedings Article | 1 September 2005 Paper

Monte Carlo analysis for the determination of conic constant of an aspheric micro lens based on a scanning white light interferometric measurement

Solomon Gugsa, Angela Davies

Proceedings Volume 5878, 58780B (2005) https://doi.org/10.1117/12.617528

KEYWORDS: Monte Carlo methods, Aspheric lenses, Error analysis, Monochromatic aberrations, Optical testing, Data centers, Zernike polynomials, Interferometry, Objectives, Calibration

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Proceedings Article | 27 August 2005 Paper

Measurement advances for micro-refractive fabrication

Neil Gardner, Angela Davies, Brent Bergner

Proceedings Volume 5858, 58580P (2005) https://doi.org/10.1117/12.622753

KEYWORDS: Calibration, Interferometers, Wavefronts, Lenses, Objectives, Metrology, Micro optics, Process control, Tolerancing, Confocal microscopy

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Proceedings Article | 19 August 2005 Paper

Retrace error evaluation on a figure-measuring interferometer

Neil Gardner, Angela Davies

Proceedings Volume 5869, 58690V (2005) https://doi.org/10.1117/12.617549

KEYWORDS: Calibration, Interferometers, Wavefronts, Optical spheres, Reflection, Micro optics, Confocal microscopy, Interferometry, Spherical lenses, Microscopes

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