Dr. Antoni Torras-Rosell
at DFM A/S
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 July 2016 Paper
Desiree Della Monica Ferreira, Anders Jakobsen, Sonny Massahi, Finn Christensen, Brian Shortt, Jørgen Garnæs, Antoni Torras-Rosell, Michael Krumrey, Levent Cibik, Stefanie Marggraf
Proceedings Volume 9905, 99055K (2016) https://doi.org/10.1117/12.2232962
KEYWORDS: X-rays, Mirrors, X-ray characterization, X-ray microscopy, Atomic force microscopy, Optical coatings, Multilayers, Surface roughness, Calibration, Data modeling

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