Bert Neubert
at Univ Hamburg
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 May 2003 Paper
Bert Neubert, Wolf-Dieter Scharfe, Guenter Huber
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472046
KEYWORDS: Monochromatic aberrations, Semiconductor lasers, Semiconductors, Helium neon lasers, Aberration theory, Phase measurement, Optical testing, Collimation, Laser applications, Interfaces

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