Christopher M. Jengo
Discipline Chief, Information & Intelligence
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 August 2004 Paper
Proceedings Volume 5409, (2004) https://doi.org/10.1117/12.543066
KEYWORDS: Short wave infrared radiation, Sensors, Image quality, Signal to noise ratio, Electronics, Reflectivity, Sensor performance, Staring arrays, Data processing, Antireflective coatings

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