Prof. Chun-Jen Chen Profile

Prof. Chun-Jen Chen

Associate Professor at National Formosa Univ

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Author

Publications (10)

Proceedings Article | 17 July 2015 Paper

To develop a flying fish egg inspection system by a digital imaging base system

Chun-Jen Chen, Wenyuh Jywe, Tung-Hsien Hsieh, Chien Hung Chen

Proceedings Volume 9524, 95240X (2015) https://doi.org/10.1117/12.2189041

KEYWORDS: Imaging systems, Particles, Inspection, Image processing, Control systems, Optical alignment, Photonic integrated circuits, Cameras, Digital imaging, Optical inspection

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Proceedings Article | 23 September 2014 Paper

To develop a geometric matching method for precision mold alignment machine

Chun-Jen Chen, Chun-Li Chang, Wenyuh Jywe

Proceedings Volume 9217, 92171B (2014) https://doi.org/10.1117/12.2060633

KEYWORDS: Optical alignment, Imaging systems, Charge-coupled devices, CCD cameras, Metals, Image processing, Precision glass molding, Glass molding, Light emitting diodes, Light sources

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Proceedings Article | 23 September 2014 Paper

A study on an automatic Ronchi test system

Chun-Li Chang, Wen-Hong Wu, Chun-Jen Chen

Proceedings Volume 9217, 92172A (2014) https://doi.org/10.1117/12.2060468

KEYWORDS: Ronchi rulings, Inspection, Glasses, Image processing, Light sources and illumination, Machine vision, Safety glasses, Wavefronts, Image quality, Phase shifts

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Proceedings Article | 22 June 2013 Paper

Surface defect inspection for power inductor

Chun-Li Chang, Wen-Hong Wu, Chun-Jen Chen, Hung-Ji Huang

Proceedings Volume 8769, 87693F (2013) https://doi.org/10.1117/12.2019346

KEYWORDS: Image filtering, Image processing, Inspection, Gaussian filters, Defect inspection, Fourier transforms, Linear filtering, Metals, Defect detection, Signal processing

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Proceedings Article | 22 June 2013 Paper

To develop a high speed auto-alignment system by dual machine vision based alignment system

Chun-Jen Chen, Wenyuh Jywe, Yunfeng Teng, Yi-Ju Chen, Min-Wei Hung

Proceedings Volume 8769, 87692Q (2013) https://doi.org/10.1117/12.2018829

KEYWORDS: CCD cameras, Optical alignment, Imaging systems, Cameras, Charge-coupled devices, Calibration, Machine vision, Manufacturing, Edge detection, Light sources

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Proceedings Article | 8 September 2010 Paper

The development of an automatic scanning path generation method for the spinneret test

Chun-Jen Chen, Min-Wei Hung, Wenyuh Jywe, Donyau Chiang

Proceedings Volume 7798, 779820 (2010) https://doi.org/10.1117/12.859237

KEYWORDS: Inspection, Capillaries, Light sources, CCD cameras, Light emitting diodes, Image segmentation, Imaging systems, Optical inspection, Microscopes, Applied research

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Proceedings Article | 2 September 2009 Paper

The development of a multifunction lens test instrument by using computer aided variable test patterns

Chun-Jen Chen, Wen-Hong Wu, Kuo-Cheng Huang

Proceedings Volume 7443, 74431N (2009) https://doi.org/10.1117/12.825444

KEYWORDS: Distortion, CCD cameras, Modulation transfer functions, CCD image sensors, LCDs, Imaging systems, Image quality, Image analysis, Digital image processing, Edge detection

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SPIE Journal Paper | 1 November 2007

High-accuracy small-angle measurement of the positioning error of a rotary table by using multiple-reflection optoelectronic methodology

Chun-Jen Chen, Psang Dain Lin

OE, Vol. 46, Issue 11, 113604, (November 2007) https://doi.org/10.1117/12.10.1117/1.2802156

KEYWORDS: Mirrors, Calibration, Autocollimators, Semiconductor lasers, Error analysis, Optical engineering, Optical testing, Optoelectronics, Reflection, Ray tracing

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Proceedings Article | 7 November 2005 Paper

Hausdorff distance based PCB inspection system with defect classification

Chun-Jen Chen, Shang-Hong Lai, Win-How Lee, Chun-Yu Lin, Terry Ku, Chiu-Hui Chen, Yueh-Ching Chung

Proceedings Volume 6000, 600008 (2005) https://doi.org/10.1117/12.639586

KEYWORDS: Metals, Inspection, Defect detection, Image classification, Classification systems, RGB color model, Distance measurement, Defect inspection, Feature extraction, Optical alignment

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Proceedings Article | 24 February 2005 Paper

Optical PCB inspection system based on Hausdorff distance

Chun-Jen Chen, Shang-Hong Lai, Shao-Wei Liu, Terry Ku, Spring Yeh

Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.587553

KEYWORDS: Inspection, Defect detection, Optical inspection, Distance measurement, Image processing, Binary data, Optical printed circuit boards, Edge detection, Electronic components, Light sources and illumination

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Showing 5 of 10 publications

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