CONFERENCE PROCEEDINGS
Advanced Search
Chunsheng Guo
at Beijing Univ of Technology
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 18 July 2023 Paper
Research on junction temperature of SiC MOSFET module
Juewen Ding, Chunsheng Guo, Hao Guo, Shaoxiong Cui
Proceedings Volume 12744, 1274427 (2023) https://doi.org/10.1117/12.2688739
KEYWORDS: Field effect transistors, Silicon carbide, Temperature metrology, Thermography, Infrared radiation, Calibration, Resistance, Thermal stability, Oxides, Infrared imaging
Proceedings Article | 23 May 2022 Paper
Experimental study on the reliable working life of PUF chip for 8 years
Proceedings Volume 12254, 1225405 (2022) https://doi.org/10.1117/12.2639117
KEYWORDS: Reliability, Integrated circuits, Oscillators, Electronic components
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top