Dr. Da Yang
at Cornell Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 May 2005 Paper
Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.607235
KEYWORDS: Glasses, Line edge roughness, Extreme ultraviolet lithography, Electron beam lithography, Lithography, Extreme ultraviolet, Polymers, Silicon, Chemical elements, Molecules

Proceedings Article | 19 January 2005 Paper
Proceedings Volume 5592, (2005) https://doi.org/10.1117/12.580239
KEYWORDS: Lithography, Electron beam lithography, X-ray lithography, Etching, X-rays, Absorption, Resistance, Extreme ultraviolet lithography, Ion beam lithography, Electrons

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