Davy Hollevoet
at Univ Gent
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 August 2008 Paper
Proceedings Volume 7064, 70640Q (2008) https://doi.org/10.1117/12.794893
KEYWORDS: Profilometers, Forensic science, Temperature metrology, Image processing, Image segmentation, Bismuth, Dielectrophoresis, Digital imaging, Metals, Chromatic aberrations

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top