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Devansh Singh
at GlobalFoundries Engineering Pvt. Ltd.
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Publications (1)
Proceedings Article | 26 May 2022 Presentation + Paper
Methodologies to handle large volumes of design and defect data for improved pre-silicon defect prediction
Proceedings Volume 12052, 1205210 (2022) https://doi.org/10.1117/12.2614185
KEYWORDS: Machine learning, Data modeling, Defect detection, Data analysis, Design for manufacturability, Yield improvement
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