Ms. Elaine Maria Stewart Profile

Elaine Maria Stewart

Aerospace Engineer

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 3 October 2022 Presentation + Paper

Establishing cleaning methods for cleanroom and safety suits at remote sites with available resources

Colette Lepage, Alan Abeel, Elaine Stewart, Ismael Rodriguez, Cole Horton, Kimberly Morales

Proceedings Volume 12224, 122240G (2022) https://doi.org/10.1117/12.2633899

KEYWORDS: James Webb Space Telescope, Inspection, Safety, Space operations, Particles, Contamination control, Contamination, Telescopes

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Proceedings Article | 3 October 2022 Presentation + Paper

Transforming any facility for meeting strict cleanliness requirements

Eve Wooldridge, Alan Abeel, Craig Jones, Kelly Henderson-Nelson, Joseph Ward, Elaine Stewart, Edwin Goldman, Jason Durner, Colette Lepage, Azuka Harbor

Proceedings Volume 12224, 122240C (2022) https://doi.org/10.1117/12.2637139

KEYWORDS: James Webb Space Telescope, Contamination, Picture Archiving and Communication System, Rockets, Mirrors, Inspection, Telescopes, Optical fibers, Observatories, Contamination control

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Proceedings Article | 3 October 2022 Presentation + Paper

Obtaining cryogenic molecular transport data for analysis

Elaine Stewart, Eve Wooldridge, Michael Woronowicz, Kelly Henderson-Nelson, George Meadows

Proceedings Volume 12224, 1222404 (2022) https://doi.org/10.1117/12.2634188

KEYWORDS: Laser imaging, Contamination, Shape memory alloys, Mirrors, James Webb Space Telescope, Observatories, Galactic astronomy, Cryogenics, Inspection, Infrared radiation

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Proceedings Article | 3 October 2022 Presentation + Paper

Predicting contamination accumulation in facilities with limited data

Elaine Stewart, Eve Wooldridge, Joseph Ward

Proceedings Volume 12224, 122240E (2022) https://doi.org/10.1117/12.2634154

KEYWORDS: James Webb Space Telescope, Contamination, Mirrors, Semiconducting wafers, Picture Archiving and Communication System, CFD analysis, Camera shutters, Particles, Observatories, Safety

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Proceedings Article | 21 August 2020 Presentation

Study of fallout metrics for contamination analysis: Vertical to horizontal particle accumulation ratio

Elaine Maria Stewart, Eve Wooldridge

Proceedings Volume 11489, 114890P (2020) https://doi.org/10.1117/12.2566604

KEYWORDS: Particles, Semiconducting wafers, Contamination analysis, Contamination, James Webb Space Telescope, Space operations, Silicon, Data centers

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