Dr. Elizabeth F. McCord
at Dupont CR&D
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 August 2009 Paper
William Gambogi, Elizabeth McCord, H. David Rosenfeld, Roger Senigo, Scott Peacock, Katherine Stika
Proceedings Volume 7412, 74120P (2009) https://doi.org/10.1117/12.826956
KEYWORDS: Failure analysis, Solar cells, X-rays, Reliability, Crystals, Copper, Glasses, Chemical analysis, Interfaces, Silicon

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