Fumin Qiu
at Chengdu Fine Optical Engineering Research Ctr
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 March 2022 Paper
Proceedings Volume 12169, 1216971 (2022) https://doi.org/10.1117/12.2624921
KEYWORDS: Etching, Tantalum, Reactive ion etching, Scanning electron microscopy, Argon, Ions, Plasma, Optoelectronic devices, Chromium, Silicon

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