For the problem of reliability in the long-term use of integrated circuit chips, this article aims to work reliably for eight years, that is, after eight years of work, all devices can work normally, and a specific assessment plan for the life test is proposed. In this paper, a physical unclonable function chip is taken as an example, and related life-span experiments are carried out for the reliability target, and a method of life evaluation of a physical unclonable function chip is proposed. This method of evaluating life can also be used for other integrated circuit chips or components.
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