My experiences are distributed in the area of research and development of optical metrology instruments, electro-optic devices, and signal processing. Optical metrology work includes the development of 3D profilometry systems, interferometric measurement systems, non-imaging LED modeling. Electro-optic device development includes laser wavelength meters, laser mode lockers, laser based alignment and metrology devices. Signal processing research includes algorithm development for absolute distance metrology algorithms, phase analysis algorithms, image processing, target detection, and opto-electronic signal processing.