Dr. Ho-Cheol Kim
Research Staff Member at IBM Research - Almaden
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Author
Publications (6)

Proceedings Article | 24 March 2017 Open Access Presentation + Paper
Seong-Sue Kim, Roman Chalykh, Hoyeon Kim, Seungkoo Lee, Changmin Park, Myungsoo Hwang, Joo-On Park, Jinhong Park, Hocheol Kim, Jinho Jeon, Insung Kim, Donggun Lee, Jihoon Na, Jungyeop Kim, Siyong Lee, Hyunwoo Kim, Seok-Woo Nam
Proceedings Volume 10143, 1014306 (2017) https://doi.org/10.1117/12.2264043
KEYWORDS: Extreme ultraviolet lithography, Manufacturing, Extreme ultraviolet, Pellicles, Photomasks, Transmittance, Logic, Scanners, Reticles, Chemical elements

Proceedings Article | 1 April 2010 Paper
Proceedings Volume 7637, 76370G (2010) https://doi.org/10.1117/12.852230
KEYWORDS: Lithography, Optical lithography, Etching, Silicon, Image processing, Dry etching, Gold, Photomasks, Reactive ion etching, Directed self assembly

Proceedings Article | 21 March 2008 Paper
Proceedings Volume 6921, 692127 (2008) https://doi.org/10.1117/12.773247
KEYWORDS: Polymers, Lithography, Optical lithography, Thin films, Polymethylmethacrylate, Process control, Nanostructures, Platinum, Gold, Directed self assembly

Proceedings Article | 20 March 2008 Paper
Ho-Cheol Kim, Joy Cheng, Oun-Ho Park, Sang-Min Park, Charles Rettner
Proceedings Volume 6921, 69212B (2008) https://doi.org/10.1117/12.772723
KEYWORDS: Scanning electron microscopy, Photomicroscopy, Electron beam lithography, Picosecond phenomena, Oxides, Polymethylmethacrylate, Lithography, Ultraviolet radiation, Plasma etching, Directed self assembly

Proceedings Article | 20 March 2008 Paper
Ho-Cheol Kim, Joy Cheng, Oun-Ho Park, Sang-Min Park, Ricardo Ruiz, Charles Black, Jed Pitera, Charles Rettner, Myron Flickner
Proceedings Volume 6921, 692129 (2008) https://doi.org/10.1117/12.772684
KEYWORDS: Photomicroscopy, Scanning electron microscopy, Silicon, Plasma etching, Picosecond phenomena, Coating, Oxides, Chromium, Lithography, Directed self assembly

Showing 5 of 6 publications
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