Ms. Hongqin Zhang Profile

Hongqin Zhang

Staff Engineer

SPIE Involvement:

Author

Proceedings Article | 17 October 2008 Paper

Wafer plane inspection evaluated for photomask production

Emily Gallagher, Karen Badger, Mark Lawliss, Yutaka Kodera, Jaione Tirapu Azpiroz, Song Pang, Hongqin Zhang, Eugenia Eugenieva, Chris Clifford, Arosha Goonesekera, Yibin Tian

Proceedings Volume 7122, 71221B (2008) https://doi.org/10.1117/12.801945

KEYWORDS: Photomasks, Inspection, Semiconducting wafers, Finite-difference time-domain method, Wafer inspection, Manufacturing, Printing, Lithography, Reticles, Optical proximity correction

Read Abstract +

Proceedings Article | 14 February 2008 Paper

Hyperspectral image visualization based on a human visual model

Hongqin Zhang, Honghong Peng, Mark Fairchild, Ethan Montag

Proceedings Volume 6806, 68060N (2008) https://doi.org/10.1117/12.766703

KEYWORDS: Visualization, Visual process modeling, Principal component analysis, Image visualization, Contrast sensitivity, RGB color model, Feature extraction, Hyperspectral imaging, Visual system, Statistical modeling

Read Abstract +

Proceedings Article | 4 May 2006 Paper

Perceptual display strategies of hyperspectral imagery based on PCA and ICA

Hongqin Zhang, David Messinger, Ethan Montag

Proceedings Volume 6233, 62330X (2006) https://doi.org/10.1117/12.665696

KEYWORDS: Independent component analysis, Principal component analysis, Visualization, Hyperspectral imaging, RGB color model, Associative arrays, Human vision and color perception, Color vision, Sensors, Colorimetry

Read Abstract +

Proceedings Article | 19 August 1998 Paper

High-performance 155-nm InGaAsP/InP strained layer quantum well laser diodes fabricated by MOCVD overgrowth method

Xiaoyu Ma, Qing Cao, Shutang Wang, Liang Guo, Zhongming Wang, Liming Wang, Guangping He, Yali Yang, Hongqin Zhang, Xiuning Zhou, Lianhui Chen

Proceedings Volume 3547, (1998) https://doi.org/10.1117/12.319615

KEYWORDS: Metalorganic chemical vapor deposition, Quantum wells, Semiconductor lasers, Laser damage threshold, Continuous wave operation, Hydrogen, Heterojunctions, Active optics, Cladding, Coating

Read Abstract +

Proceedings Article | 19 August 1998 Paper

Study of single-mode 650-nm AlGaInP quantum well laser diodes for DVD

Xiaoyu Ma, Qing Cao, Shutang Wang, Liang Guo, Liming Wang, Yali Yang, Hongqin Zhang, Xiaoyan Zhang, Lianhui Chen

Proceedings Volume 3547, (1998) https://doi.org/10.1117/12.319602

KEYWORDS: Semiconductor lasers, Digital video discs, Quantum wells, Aluminium gallium indium phosphide, Metalorganic chemical vapor deposition, Cladding, Laser damage threshold, Waveguides, Continuous wave operation

Read Abstract +

Proceedings Article | 22 June 1998 Paper

High-temperature operation of 650-nm AlGaInP quantum well laser diodes grown by LP-MOCVD

Xiaoyu Ma, Qing Cao, Guohong Wang, Liang Guo, Peng Lian, Liming Wang, Xiaoyan Zhang, Yali Yang, Hongqin Zhang, Lianhui Chen

Proceedings Volume 3419, 34190I (1998) https://doi.org/10.1117/12.311001

KEYWORDS: Semiconductor lasers, Aluminium gallium indium phosphide, Quantum wells, Laser damage threshold, Metalorganic chemical vapor deposition, Continuous wave operation

Read Abstract +

Proceedings Article | 30 September 1996 Paper

High-performance 1.3-um and 1.55-um InGaAsP/InP strained-layer quantum well lasers grown by LP-MOCVD

Xiaoyu Ma, Shutang Wang, Feike Xiong, Liang Guo, Zhongming Wang, Liming Wang, Xiaoyan Zhang, Guoxi Sun, Caihong Xia, Tian Zhu, Yali Yang, Hongqin Zhang, Guangping He, Shuqin Yao, Kekui Bi, Lianhui Chen

Proceedings Volume 2891, (1996) https://doi.org/10.1117/12.253174

KEYWORDS: Laser damage threshold, Quantum wells, Laser stabilization, Metalorganic chemical vapor deposition, Continuous wave operation, Heterojunctions, Barium, Semiconductor lasers, Quantum efficiency, Information operations

Read Abstract +

Showing 5 of 7 publications

Conference Committee Involvement (2)

Image Quality and System Performance IX

24 January 2012 | Burlingame, California, United States

Image Quality and System Performance VIII

24 January 2011 | San Francisco Airport, California, United States

Keywords/Phrases

Search In:

Publication Years