Dr. Jaime Enrique Meneses Fonseca
Group Director at Univ Industrial de Santander
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 13 May 2019 Paper
Proceedings Volume 10991, 1099104 (2019) https://doi.org/10.1117/12.2519034
KEYWORDS: Skin, Calibration, Cameras, 3D modeling, 3D metrology, Imaging systems, Fringe analysis, 3D image processing, Dermatology, Profilometers, 3D acquisition, 3D imaging metrology, Medical diagnostic instruments

Proceedings Article | 13 May 2019 Paper
Proceedings Volume 10991, 1099102 (2019) https://doi.org/10.1117/12.2518649
KEYWORDS: Cameras, Skin, Projection systems, 3D modeling, Imaging systems, Fourier transforms, Calibration, Light emitting diodes, Fringe analysis, Dermatology, Structured light, 3D metrology, 3D imaging metrology, Dimensional metrology

Proceedings Article | 5 June 2014 Paper
Andrés González, Carlos Contreras, Jaime Meneses
Proceedings Volume 9110, 91100X (2014) https://doi.org/10.1117/12.2069929
KEYWORDS: Calibration, Cameras, Projection systems, Imaging systems, Systems modeling, Fringe analysis, Digital cameras, 3D metrology, 3D modeling, 3D image processing

Proceedings Article | 28 May 2014 Paper
Javier Arciniegas, Andrés González, L. Quintero, Carlos Contreras, Jaime Meneses
Proceedings Volume 9110, 91100U (2014) https://doi.org/10.1117/12.2050220
KEYWORDS: Inspection, Imaging systems, 3D modeling, Projection systems, Cameras, Phase shifting, 3D metrology, CCD cameras, Resistance

Proceedings Article | 18 November 2013 Paper
Laura Chaparro, Carlos Contreras, Jaime Meneses
Proceedings Volume 8785, 87853D (2013) https://doi.org/10.1117/12.2025832
KEYWORDS: Ultrasonics, Transducers, Ranging, Sensors, Fourier transforms, Signal processing, Modulation, Distance measurement, Matrices, Binary data

Showing 5 of 14 publications
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