Dr. James Mure-Dubois Profile

Dr. James Mure-Dubois

Research Scientist at Zürcher Hochschule für Angewandte Wissenschaften

SPIE Involvement:

Author

Area of Expertise:

3D vision , 3D image processing , range image registration , time-of-flight cameras , microvision , scattering compensation

Publications (5)

Proceedings Article | 29 August 2008 Paper

Merging of range images for inspection or safety applications

James Mure-Dubois, Heinz Hügli

Proceedings Volume 7066, 70660K (2008) https://doi.org/10.1117/12.793629

KEYWORDS: Clouds, Cameras, Microscopes, Imaging systems, Safety, Inspection, Time of flight cameras, 3D image processing, Sensors, Range imaging

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Proceedings Article | 25 April 2008 Paper

Automated inspection of microlens arrays

James Mure-Dubois, Heinz Hügli

Proceedings Volume 7000, 700008 (2008) https://doi.org/10.1117/12.781015

KEYWORDS: Inspection, Metals, Defect detection, Lenses, Image processing, Microlens array, Databases, Image segmentation, Microlens, Coating

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Proceedings Article | 10 October 2007 Paper

Optimized scattering compensation for time-of-flight camera

James Mure-Dubois, Heinz Hügli

Proceedings Volume 6762, 67620H (2007) https://doi.org/10.1117/12.733961

KEYWORDS: Scattering, Scattering compensation, Image filtering, Point spread functions, Cameras, Electronic filtering, Deconvolution, Time of flight cameras, Light scattering, Image processing

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Proceedings Article | 13 October 2006 Paper

3D vision methods and selected experiences in micro and macro applications

H. Hügli, J. Mure-Dubois

Proceedings Volume 6382, 638209 (2006) https://doi.org/10.1117/12.693635

KEYWORDS: 3D vision, 3D image processing, Sensors, Three dimensional sensing, 3D acquisition, Range imaging, Interferometry, Video, Cameras, Imaging systems

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Proceedings Article | 12 October 2006 Paper

Embedded 3D vision system for automated micro-assembly

James Mure-Dubois, Heinz Hügli

Proceedings Volume 6382, 63820J (2006) https://doi.org/10.1117/12.686675

KEYWORDS: Sensors, 3D vision, Imaging systems, 3D metrology, Microscopes, Miniature imaging systems, Embedded systems, Image resolution, Cameras, Image processing

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