Juheon Lee
at KAIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 March 2023 Presentation
Proceedings Volume PC12389, PC123890Q (2023) https://doi.org/10.1117/12.2653738
KEYWORDS: Dielectrics, Multiplexing, Tomography, Cameras, 3D metrology, Refractive index, Polarized microscopy, Optical testing, Optical properties, Microscopy

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