Dr. Lirong Sun
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 4 October 2024 Presentation
Proceedings Volume PC13116, PC1311602 (2024) https://doi.org/10.1117/12.3025638
KEYWORDS: Sputter deposition, Magnetrons, Ellipsometry, Refractive index, Optical properties, Materials properties, Hyperbolic metamaterials, Vacuum, Spectroscopic ellipsometry, Silicon

Proceedings Article | 2 October 2024 Presentation + Paper
Proceedings Volume 13109, 131090C (2024) https://doi.org/10.1117/12.3029415
KEYWORDS: Bandpass filters, Metals, Tunable filters, Dielectrics, Transmittance, Silver, Refractive index, Dielectric filters, Design, Multilayers

Proceedings Article | 28 August 2024 Presentation
Lauren Schatz, Jeff Richey, Peter Stevenson, Lirong Sun, Nathan Episcopo, Tod Laurvick, Jeremiah Gaulding, Mala Mateen, Robert Johnson
Proceedings Volume 13097, 1309707 (2024) https://doi.org/10.1117/12.3019077

Proceedings Article | 26 August 2024 Poster
Lauren Schatz, Tod Laurvick, Lirong Sun, Jeremiah Gaulding, Nathan Episcopo, Peter Stevenson, Maggie Lankford, Jeff Richey, Mala Mateen, Robert Johnson, Sebastiaan Haffert
Proceedings Volume 13100, 131003Q (2024) https://doi.org/10.1117/12.3019222

Proceedings Article | 5 October 2023 Poster + Paper
Proceedings Volume 12682, 126820H (2023) https://doi.org/10.1117/12.2685092
KEYWORDS: Transmittance, Metals, Silver, Aluminum, Dispersion, Dielectrics, Signal attenuation, Refractive index, Data modeling, Wave propagation

Proceedings Article | 5 October 2015 Presentation
Lirong Sun, Neil Murphy, John Jones, John Grant
Proceedings Volume 9556, 955605 (2015) https://doi.org/10.1117/12.2188902
KEYWORDS: Thin films, Oxides, Copper, Silicon, Germanium, Refractive index, Ellipsometry, Reflectance spectroscopy, Modulation, Sputter deposition

SPIE Journal Paper | 5 August 2015
John Jones, Jonathan Goldstein, Steven Smith, Gerald Landis, Lawrence Grazulis, Neil Murphy, Gregory Kozlowski, Rachel Jakubiak, Charles Stutz, Lirong Sun
JNP, Vol. 9, Issue 01, 093590, (August 2015) https://doi.org/10.1117/12.10.1117/1.JNP.9.093590
KEYWORDS: Silicon, Ellipsometry, Thin films, Data modeling, Molybdenum, Oxides, Capacitance, Excimer lasers, Glasses, Oxygen

SPIE Journal Paper | 14 February 2014 Open Access
John Jones, Lirong Sun, Neil Murphy, Tyson Back, Matthew Lange, Jessica Remmert, Paul Murray
JNP, Vol. 8, Issue 01, 089999, (February 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.089999
KEYWORDS: Thin films, Pulsed laser deposition, Ellipsometry, Sun, Roads, Metamaterials, Photonic nanostructures, Nanostructured thin films, Analytical research, Information technology

SPIE Journal Paper | 5 February 2014
John Jones, Lirong Sun, Neil Murphy, Tyson Back, Matthew Lange, Jessica Remmert, P. Terrance Murray, Rachel Jakubiak
JNP, Vol. 8, Issue 01, 083999, (February 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.083999
KEYWORDS: Thin films, Carbon, Ellipsometry, Data modeling, Pulsed laser operation, Pulsed laser deposition, Raman spectroscopy, Atomic force microscopy, Tunable lasers, Silicon

Proceedings Article | 9 October 2012 Paper
Shane McConnell, Michael Seal, Stephen Nauyoks, Neil Murphy, Lirong Sun, Michael Marciniak
Proceedings Volume 8457, 845736 (2012) https://doi.org/10.1117/12.930397
KEYWORDS: Reflectivity, Silver, Resonators, Germanium, Temperature metrology, Metals, Absorption, Infrared spectroscopy, Black bodies, Spectroscopy

SPIE Journal Paper | 1 April 2011
JM3, Vol. 10, Issue 02, 023006, (April 2011) https://doi.org/10.1117/12.10.1117/1.3574136
KEYWORDS: Etching, Silicon, Reactive ion etching, Plasma, Polymers, Ions, Micro optics, Plasma etching, Scanning electron microscopy, Polymer thin films

Showing 5 of 11 publications
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