Prof. Mahendra Prasad Kothiyal Profile

Prof. Mahendra Prasad Kothiyal

SPIE Involvement:

Author

Publications (28)

Proceedings Article | 17 July 2015 Paper

White light single-shot interferometry with colour CCD camera for optical inspection of microsystems

Paul Kumar Upputuri, Manojit Pramanik, Krishna Mohan Nandigana, Mahendra Prasad Kothiyal

Proceedings Volume 9524, 95240C (2015) https://doi.org/10.1117/12.2185802

KEYWORDS: Interferometry, CCD cameras, Phase shifts, Fringe analysis, Microsystems, Optical interferometry, Reflectivity, Profiling, Charge-coupled devices, Interferometers

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Proceedings Article | 4 March 2015 Paper

Two-wavelength microscopic speckle interferometry using colour CCD camera

Paul Upputuri, Manojit Pramanik, Mahendra Kothiyal, Krishna Nandigana

Proceedings Volume 9302, 93023K (2015) https://doi.org/10.1117/12.2081122

KEYWORDS: Phase shifts, CCD cameras, Speckle interferometry, Nondestructive evaluation, Speckle, Charge-coupled devices, Speckle pattern, Data acquisition, Interferometry, Ferroelectric materials

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Proceedings Article | 4 March 2015 Paper

White light interferometer with color CCD for 3D-surface profiling of microsystems

Paul Upputuri, Manojit Pramanik, Krishna Nandigana, Mahendra Kothiyal

Proceedings Volume 9302, 93023R (2015) https://doi.org/10.1117/12.2081117

KEYWORDS: Profiling, Charge-coupled devices, Interferometers, Microsystems, Optical interferometry, CCD cameras, Phase shifts, Fringe analysis, 3D metrology, RGB color model

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SPIE Journal Paper | 3 November 2014

Use of two wavelengths in microscopic TV holography for nondestructive testing

Paul Kumar Upputuri, Somasundaram Umapathy, Manojit Pramanik, Mahendra Prasad Kothiyal, Krishna Mohan Nandigana

OE, Vol. 53, Issue 11, 110501, (November 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.11.110501

KEYWORDS: Nondestructive evaluation, Microscopic TV holography, CCD cameras, Charge-coupled devices, Cameras, Holography, Data acquisition, Speckle, Phase measurement, Collimation

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Proceedings Article | 10 September 2009 Paper

Microscopic TV sherography for microsystems characterization

U. Kumar, N. Mohan, M. Kothiyal

Proceedings Volume 7432, 74320T (2009) https://doi.org/10.1117/12.825766

KEYWORDS: Digital signal processing, Speckle, Digital photography, Microsystems, Interferometers, Mirrors, Phase shifts, Digital filtering, Photography, Fringe analysis

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SPIE Journal Paper | 1 July 2009

Measurement of discontinuous surfaces using multiple-wavelength interferometry

Paul Kumar Upputuri, Nandigana Mohan, Mahendra Kothiyal

OE, Vol. 48, Issue 07, 073603, (July 2009) https://doi.org/10.1117/12.10.1117/1.3159867

KEYWORDS: Interferometry, Phase shifts, Phase interferometry, Silicon, Optical engineering, Charge-coupled devices, Phase measurement, Optical interferometry, Ferroelectric materials, Phase shifting

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SPIE Journal Paper | 1 February 2009

Deformation and shape measurement using multiple wavelength microscopic TV holography

U. Paul Kumar, Nandigana Krishna Mohan, Mahendra Kothiyal, Anand Asundi

OE, Vol. 48, Issue 02, 023601, (February 2009) https://doi.org/10.1117/12.10.1117/1.3083260

KEYWORDS: Microscopic TV holography, Holography, Line scan image sensors, Phase shifts, Shape analysis, Fringe analysis, Microelectromechanical systems, Ferroelectric materials, Speckle, Optical engineering

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Proceedings Article | 3 October 2008 Paper

Deformation analysis on micro objects using multiple wavelength microscopic TV holography

U. Paul Kumar, N. Krishna Mohan, M. Kothiyal, A. Asundi

Proceedings Volume 7155, 71550D (2008) https://doi.org/10.1117/12.814511

KEYWORDS: Phase shifts, Microscopic TV holography, Holography, Fringe analysis, Speckle, Ferroelectric materials, Microelectromechanical systems, Sensors, Imaging systems, Mirrors

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Proceedings Article | 11 August 2008 Paper

Multiple wavelength interferometry for surface profiling

U. Paul Kumar, N. Krishna Mohan, M. Kothiyal

Proceedings Volume 7063, 70630W (2008) https://doi.org/10.1117/12.793571

KEYWORDS: Interferometry, Phase shifts, Optical interferometry, Phase interferometry, Phase shifting, Silicon, Profiling, Ferroelectric materials, Bismuth, CCD cameras

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Proceedings Article | 17 September 2007 Paper

Mode confinement of light wave propagation in a new polymeric waveguide studied by the m-lines technique

K. Sathiyamoorthy, Pushpa Kurian, C. Vijayan, M. Kothiyal

Proceedings Volume 6698, 669818 (2007) https://doi.org/10.1117/12.733466

KEYWORDS: Waveguides, Refractive index, Polymers, Prisms, Polymer multimode waveguides, Birefringence, Light wave propagation, Signal attenuation, Spectroscopy, Transparency

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Proceedings Article | 14 September 2007 Paper

Non-destructive evaluation (NDE) using multi-aperture DSPI system and fast Fourier transform method

Basanta Bhaduri, N. Krishna Mohan, M. Kothiyal

Proceedings Volume 6671, 667115 (2007) https://doi.org/10.1117/12.732772

KEYWORDS: Fourier transforms, Nondestructive evaluation, Charge-coupled devices, Speckle, Mirrors, Speckle pattern, Phase shifting, Diffraction, Interferometry, Imaging systems

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SPIE Journal Paper | 1 May 2007

(1,N) spatial phase-shifting technique in digital speckle pattern interferometry and digital shearography for nondestructive evaluation

Basanta Bhaduri, Nandigana Krishna Mohan, Mahendra Kothiyal

OE, Vol. 46, Issue 05, 051009, (May 2007) https://doi.org/10.1117/12.10.1117/1.2740749

KEYWORDS: Nondestructive evaluation, Phase shifts, Speckle, Mirrors, Polymethylmethacrylate, Speckle pattern, Surface plasmons, Charge-coupled devices, Interferometry, Shearography

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Proceedings Article | 12 October 2006 Paper

An improved achromatic half-wave plate phase shifter for white light interferometry

Suja Helen Simson, Mahendra Prasad Kothiyal, Rajpal Singh Sirohi

Proceedings Volume 6382, 63820L (2006) https://doi.org/10.1117/12.685080

KEYWORDS: Phase shifts, Interferometers, Wave plates, Polarization, Circular polarizers, Optical interferometry, Jones calculus, Polarizers, Phase interferometry, Fringe analysis

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SPIE Journal Paper | 1 October 2006

Cyclic-path digital speckle shear pattern interferometer: use of polarization phase-shifting method

Basanta Bhaduri, Nandigana Krishna Mohan, Mahendra Kothiyal

OE, Vol. 45, Issue 10, 105604, (October 2006) https://doi.org/10.1117/12.10.1117/1.2361194

KEYWORDS: Speckle, Interferometers, Polarization, Phase shifts, Speckle pattern, Fringe analysis, Optical engineering, Phase shifting, Polarizers, Mirrors

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Proceedings Article | 14 August 2006 Paper

Vibration mode shape visualization with dual function DSPI system

Basanta Bhaduri, M. Kothiyal, N. Krishna Mohan

Proceedings Volume 6292, 629217 (2006) https://doi.org/10.1117/12.680042

KEYWORDS: Shearography, Visualization, Mirrors, Fringe analysis, Phase shifts, Ferroelectric materials, Aluminum, Interferometry, Charge-coupled devices, Speckle pattern

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Proceedings Article | 14 August 2006 Paper

Thickness-profile measurement of transparent thin-film layers by spectrally resolved phase-shifting interferometry

Sanjit Debnath, Mahendra Kothiyal, Joanna Schmit, Parameswaran Hariharan

Proceedings Volume 6292, 629214 (2006) https://doi.org/10.1117/12.679484

KEYWORDS: Thin films, Phase shifts, Phase interferometry, Phase measurement, Refractive index, Ferroelectric materials, Interferometry, Phase shifting, Silicon, Spectroscopy

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Proceedings Article | 14 August 2006 Paper

Analysis of spectrally resolved white light interferometry by Hilbert transform method

Sanjit Debnath, Mahendra Kothiyal

Proceedings Volume 6292, 62920P (2006) https://doi.org/10.1117/12.680179

KEYWORDS: Optical interferometry, Spectroscopy, Light sources, Interferometers, Phase shifting, Interferometry, Phase interferometry, Phase shifts, Microscopes, Profiling

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Proceedings Article | 7 March 2006 Paper

Polarization phase shifting in white-light interferometry

S. Suja Helen, Mahendra Kothiyal, Rajpal Sirohi

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498448

KEYWORDS: Phase shifts, Ferroelectric materials, Polarization, Phase shifting, Optical interferometry, Phase interferometry, Interferometers, Beam splitters, Interferometry, Fourier transforms

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Proceedings Article | 25 August 2005 Paper

Use of monochromatic phase data for improved profile measurement in spectrally resolved white light interferometry

S. Debnath, D. Sharma, M. Kothiyal

Proceedings Volume 5879, 58790J (2005) https://doi.org/10.1117/12.614271

KEYWORDS: Optical interferometry, Spectroscopy, Phase shifting, Light sources, Interferometers, Ferroelectric materials, Phase shifts, Surface finishing, Phase measurement, Phase interferometry

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SPIE Journal Paper | 1 January 2005

Optical profiler based on spectrally resolved white light interferometry

Sanjit Debnath, Mahendra Kothiyal

OE, Vol. 44, Issue 01, 013606, (January 2005) https://doi.org/10.1117/12.10.1117/1.1828468

KEYWORDS: Phase shifts, Ferroelectric materials, Charge-coupled devices, Interferometers, Optical interferometry, Cadmium, Spectroscopy, Lamps, Spectrographs, Phase shifting

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SPIE Journal Paper | 1 July 2001

Analysis of spectrally resolved white light interferograms: use of phase shifting technique

S. Suja Helen, Mahendra Kothiyal, Rajpal Sirohi

OE, Vol. 40, Issue 07, (July 2001) https://doi.org/10.1117/12.10.1117/1.1383997

KEYWORDS: Phase shifts, Phase shifting, Ferroelectric materials, Interferometers, Optical interferometry, Phase interferometry, Polarization, Spectroscopy, Calibration, Light sources

Proceedings Article | 11 November 1999 Paper

Spectrally resolved white-light interferometry for profilometry with polarization phase shifter

S. Suja Helen, Mahendra Kothiyal, Rajpal Sirohi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369373

KEYWORDS: Phase shifts, Polarization, Interferometers, Phase shifting, Spectroscopy, Optical interferometry, Phase interferometry, Interferometry, Chromium, Profiling

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Proceedings Article | 19 July 1999 Paper

Heterodyne temporal speckle pattern interferometry

Hans Tiziani, Mahendra Kothiyal, Charles Joenathan, Pascal Haible

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.355067

KEYWORDS: Interferometry, Speckle pattern, Heterodyning, Modulation, Phase shift keying, Speckle, Optical filters, Linear filtering, Fourier transforms, Physics

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Proceedings Article | 29 April 1999 Paper

Experimental characterization of photorefractive beam coupling in BaTiO3 crystal at multiple wavelengths

Mohammad Majles Ara, C. Vijayan, Nandigana Krishna Mohan, Mahendra Kothiyal, Rajpal Sirohi

Proceedings Volume 3729, (1999) https://doi.org/10.1117/12.346779

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SPIE Journal Paper | 1 November 1998

Phase step calibration and phase measurement in image plane holography using BaTiO3 crystal as a recording medium

S. Suja Helen, Mohammad Majles Ara, J. Darlin, Nandigana Krishna Mohan, Mahendra Kothiyal, Rajpal Sirohi

OE, Vol. 37, Issue 11, (November 1998) https://doi.org/10.1117/12.10.1117/1.601879

KEYWORDS: Crystals, Calibration, Fringe analysis, Phase measurement, Phase shifts, Laser crystals, Holography, Ferroelectric materials, Visualization, Diffraction gratings

SPIE Journal Paper | 1 May 1998

Hybrid wedge plate-grating interferometer for collimation testing

J. Darlin, Mahendra Kothiyal, Rajpal Sirohi

OE, Vol. 37, Issue 05, (May 1998) https://doi.org/10.1117/12.10.1117/1.601672

KEYWORDS: Collimation, Interferometers, Interferometry, Fringe analysis, Spatial frequencies, Wavefronts, Optical engineering, Shearing interferometers, Ronchi rulings, Optical design

Proceedings Article | 12 December 1994 Paper

Improved collimation testing with a multiple beam wedge plate lateral shear interferometer

P. Senthikumaran, K. Sriram, Mahendra Kothiyal, Rajpal Sirohi

Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195929

KEYWORDS: Collimation, Interferometers, Wavefronts, Beam splitters, Visibility, Fringe analysis, Mirrors, Shearing interferometers, Refractive index, Spherical lenses

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SPIE Journal Paper | 1 January 1993

Self-referencing collimation testing techniques

K. Sriram, Mahendra Kothiyal, Rajpal Sirohi

OE, Vol. 32, Issue 01, (January 1993) https://doi.org/10.1117/12.10.1117/12.60081

KEYWORDS: Collimation, Fringe analysis, Moire patterns, Interferometry, Diffraction gratings, Shearing interferometers, Optical testing, Polishing, Physics, Laser interferometry

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Showing 5 of 28 publications

Conference Committee Involvement (3)

Interferometry XV: Techniques and Analysis

2 August 2010 | San Diego, California, United States

Interferometry XIV: Techniques and Analysis

11 August 2008 | San Diego, California, United States

Interferometry XIII: Techniques and Analysis

14 August 2006 | San Diego, California, United States

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