Dr. Manfred Reiche Profile

Dr. Manfred Reiche

at Max-Planck-Institut für Mikrostrukturphysik

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 15 October 2012 Paper

Characterization of dislocation-based nanotransistors

Manfred Reiche, Martin Kittler

Proceedings Volume 8549, 854929 (2012) https://doi.org/10.1117/12.927401

KEYWORDS: Semiconducting wafers, Silicon, Wafer bonding, Field effect transistors, Crystals, Oxides, Transmission electron microscopy, Transistors, Interfaces, Nanowires

Read Abstract +

Proceedings Article | 13 February 2008 Paper

Stark effect at dislocations in silicon for modulation of a 1.5-µm light emitter

Martin Kittler, Manfred Reiche, Teimuraz Mchedlidze, Tzanimir Arguirov, Guobin Jia, Winfried Seifert, Stephan Suckow, Thomas Wilhelm

Proceedings Volume 6898, 68980G (2008) https://doi.org/10.1117/12.773295

KEYWORDS: Silicon, Electroluminescence, Light emitting diodes, Luminescence, Modulators, Diodes, Modulation, Semiconducting wafers, Wafer bonding, Electro optics

Read Abstract +

Proceedings Article | 22 January 2005 Paper

Spatial light modulators with monocrystalline silicon micromirrors made by wafer bonding

Thor Bakke, Martin Friedrichs, Benjamin Voelker, Manfred Reiche, Lars Leonardsson, Harald Schenk, Hubert Lakner

Proceedings Volume 5715, (2005) https://doi.org/10.1117/12.590567

KEYWORDS: Semiconducting wafers, Wafer bonding, Mirrors, Silicon, Adhesives, Electrodes, Polymers, Oxides, Micromirrors, Aluminum

Read Abstract +

Proceedings Article | 5 November 2002 Paper

Highly luminescent Si quantum dots: new ways for size, position, and density control

Margit Zacharias, Johannes Heitmann, Lixin Yi, Rolf Scholz, Manfred Reiche, Ulrich Goesele

Proceedings Volume 4808, (2002) https://doi.org/10.1117/12.452220

KEYWORDS: Silicon, Superlattices, Annealing, Crystals, Nanocrystals, Luminescence, Transmission electron microscopy, Absorption, Plasma enhanced chemical vapor deposition, Oxides

Read Abstract +

Proceedings Article | 15 October 2001 Paper

Ultrathin wafers: processing and defect issues

Manfred Reiche

Proceedings Volume 4600, (2001) https://doi.org/10.1117/12.444658

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years