Prof. Marc Jobin Profile

Prof. Marc Jobin

at HEPIA

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Publications (6)

Proceedings Article | 15 August 2023 Paper

Development of a liquid interferometric optical microscope (L-IOM) in phase-shift mode with standard Mirau objectives

Marc Jobin

Proceedings Volume 12618, 126182W (2023) https://doi.org/10.1117/12.2674143

KEYWORDS: Liquids, Light sources and illumination, Helium neon lasers, Optical interferometry, Interferograms, Optical microscopes, Halogens

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Proceedings Article | 27 April 2016 Paper

Dielectric impedance and optical performance of quantum dots doped OLEDs

Marc Jobin, Cédric Pellodi, Nicolas Emmenegger

Proceedings Volume 9895, 98950F (2016) https://doi.org/10.1117/12.2227821

KEYWORDS: Organic light emitting diodes, Quantum dots, Atomic force microscopy, Dielectrics, Coating, Aluminum, Thin films, Interfaces

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We investigate the effect of the incorporation of CdSe quantum dots (QD) in the standard ITO/TPD/Alq3/Al organic light emitting diodes (OLED's). The OLED's structures have been prepared in a double glove box coupled to a vacuum chamber containing both low and high temperature evaporators. For the standard (undoped) OLED's, the hole transport layer (HTL) consisting of 50nm of TPD is deposited by spin coating (8000rpm during 60 sec) and the 40nm of Alq3 were deposited at 2A/sec (organic crucible Radak-I). 150nm of Al were finally evaporated at 5A/s. For the CdSe-doped OLED's, the procedure was the same expect that the QD's were mixed with TPD in toluene before spin coating. During the thermal processing if the film, the QD's are expected to segregate to the surface, and then will be located at the TPD/Alq3 interface. The various layers were imaged by Atomic Force Microscopy (AFM) at each phase of the structure deposition, and we could indeed visualize the segregated QD's above the TPD film. AFM was systematically used to monitor the homogeneity and the thickness of the various films. The impedance of the non-encapsulated films structures were measured in air in the 40-40MHz frequency range, with bias at 0V (non-emitting), 2V (low emission) and 8V (strong emission). The corresponding dielectric spectra were analyzed with the standard Havriliak-Negami (HV) formula, where the conductive term has been subtracted from the data in case of light emission. We have measured a relaxation ranging from 100kHZ for the unbiased structure to 1MHz for 8V (strong emission). Apart from this expected relaxation, we found a second relaxation mechanism around 10 MHz. The origin of this second peak will be discussed. To monitor the optical emission of the OLED's, we have built a specific bench which allows for the quantitative measurement of the emission spectra and the dynamics behavior of the OLED's (raising and falling time). We found that the incorporation of the QD's unfortunately results in the decrease of the light emission but with a favorable modification of the light spectrum (around 700nm).

Proceedings Article | 15 May 2014 Paper

Organic solar cells improvement with quantum dots, up-converters and MoO3 hole transport layers

Marc Jobin, Cédric Pellodi

Proceedings Volume 9140, 914008 (2014) https://doi.org/10.1117/12.2051767

KEYWORDS: Solar cells, Quantum dots, Organic photovoltaics, Sol-gels, Solar energy, Oxides, Absorption, Photons, Electron transport, Aluminum

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Proceedings Article | 9 May 2012 Paper

Full wafer metrology for chemically graded thin films

Marc Jobin, Stéphane Jotterand, Cédric Pellodi, Sergio dos Santos, Cosmin Silviu Sandu, Estelle Wagner, Giacomo Benvenuti

Proceedings Volume 8430, 843009 (2012) https://doi.org/10.1117/12.922652

KEYWORDS: Semiconducting wafers, Wafer-level optics, Niobium, Thin films, Resistance, Metrology, Reflectivity, Oxides, Neodymium, Titanium dioxide

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Proceedings Article | 10 September 2007 Paper

Use of light-emitting diode (LED) in interference microscopy

Marc Jobin, Raphael Foschia

Proceedings Volume 6672, 667205 (2007) https://doi.org/10.1117/12.734255

KEYWORDS: Light emitting diodes, Halogens, Phase shifts, Microscopy, Microscopes, Lamps, Blue light emitting diodes, Optical filters, Reconstruction algorithms, Charge-coupled devices

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