Mr. Maurice S. Karpman Profile

Maurice S. Karpman

at The Charles Stark Draper Laboratory

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 18 February 2008 Paper

Measuring MEMS through silicon caps

Matthew Hazel, Maurice Karpman

Proceedings Volume 6884, 68840F (2008) https://doi.org/10.1117/12.772112

KEYWORDS: Microelectromechanical systems, Infrared imaging, Confocal microscopy, Infrared microscopy, Microscopy, Silicon, Sensors, Inspection, Microscopes, Infrared radiation

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Proceedings Article | 10 January 1997 Paper

Virtual displays for entertainment applications: hitting cost/performance with LED arrays

Maurice Karpman, Ben Wells

Proceedings Volume 3000, (1997) https://doi.org/10.1117/12.263487

KEYWORDS: Light emitting diodes, LED displays, Prototyping, Mirrors, Optical filters, Head, Control systems, Eye, Image resolution, Beam splitters

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Proceedings Article | 27 September 1993 Paper

Glass-on-chip package for CCDs

Maurice Karpman, Christopher Reiche

Proceedings Volume 1999, (1993) https://doi.org/10.1117/12.158593

KEYWORDS: Glasses, Adhesives, Charge-coupled devices, Cameras, Optical filters, CCD cameras, Imaging systems, Active optics, Epoxies, Optical alignment

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Conference Committee Involvement (7)

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII

3 February 2014 | San Francisco, California, United States

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII

4 February 2013 | San Francisco, California, United States

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI

23 January 2012 | San Francisco, California, United States

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

24 January 2011 | San Francisco, California, United States

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX

25 January 2010 | San Francisco, California, United States

Showing 5 of 7 Conference Committees

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