Nicholas Moelders
at Ion Optics Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 5 September 2002 Paper
Mark McNeal, Nicholas Moelders, Martin Pralle, Irina Puscasu, Lisa Last, William Ho, Anton Greenwald, James Daly, Edward Johnson, Thomas George
Proceedings Volume 4815, (2002) https://doi.org/10.1117/12.482316
KEYWORDS: Sensors, Carbon dioxide, Infrared radiation, Gas sensors, Microelectromechanical systems, Absorption, Infrared spectroscopy, Thermography, Infrared detectors, Resistance

Proceedings Article | 22 February 2002 Paper
James Daly, Edward Johnson, Nicholas Moelders, Mark McNeal, Martin Pralle, Anton Greenwald, William Ho, Irina Puscasu, Thomas George, Daniel Choi
Proceedings Volume 4576, (2002) https://doi.org/10.1117/12.456941
KEYWORDS: Sensors, Microelectromechanical systems, Carbon monoxide, Absorption, Infrared spectroscopy, Infrared radiation, Infrared sensors, Ions, Signal detection, Gases

Proceedings Article | 7 February 2002 Paper
Martin Pralle, Mark McNeal, Nicholas Moelders, Lisa Last, William Ho, Anton Greenwald, James Daly, Irina Puscasu, Edward Johnson, Ihab El-Kady, Rana Biswas
Proceedings Volume 4574, (2002) https://doi.org/10.1117/12.455159
KEYWORDS: Silicon, Reflectivity, Infrared radiation, Metals, Absorption, Microelectromechanical systems, Sensors, Surface plasmons, Infrared spectroscopy, Carbon monoxide

Proceedings Article | 2 October 2001 Paper
Nicholas Moelders, Mark McNeal, Martin Pralle, Lisa Last, William Ho, Anton Greenwald, James Daly, Edward Johnson, Thomas George, Daniel Choi
Proceedings Volume 4561, (2001) https://doi.org/10.1117/12.443100
KEYWORDS: Sensors, Microelectromechanical systems, Silicon, Carbon monoxide, Infrared radiation, Thermography, Thermal modeling, Gas sensors, Etching, Instrument modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top