Peter S. Walecki
at Sunrise Optical LLC
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 March 2015 Paper
Proceedings Volume 9383, 93830W (2015) https://doi.org/10.1117/12.2075540
KEYWORDS: Metrology, Reflectivity, Diffusers, Manufacturing, Light emitting diodes, Nickel, Surface finishing, Specular reflections, Optics manufacturing, Surface roughness

Proceedings Article | 1 June 2011 Paper
Proceedings Volume 8036, 803612 (2011) https://doi.org/10.1117/12.883385
KEYWORDS: Confocal microscopy, Microscopes, Objectives, Reflectivity, Microscopy, Mirrors, Reflection, Multiphoton microscopy, Stimulated emission depletion microscopy, Polarization

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top