Dr. R. P. Shukla Profile

Dr. R. P. Shukla

Scientific Officer at Bhabha Atomic Research Ctr

SPIE Involvement:

Author

Publications (1)

SPIE Journal Paper | 1 June 1994

Interferometric determination of thickness of free-standing submicron Formvar films

R. Shukla, Avijit Chowdhury, Parshotam Gupta

OE, Vol. 33, Issue 06, (June 1994) https://doi.org/10.1117/12.10.1117/12.167177

KEYWORDS: Thin films, Refractive index, Interferometers, Interferometry, Extreme ultraviolet, Profilometers, Glasses, X-rays, Optical filters, Reflection

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years