Ms. Renu Kumawat Profile

Renu Kumawat

at MNIT

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 28 January 2013 Paper

Reliable circuit analysis and design using nanoscale devices

Renu Kumawat, Vineet Sahula, M. Gaur

Proceedings Volume 8760, 87602C (2013) https://doi.org/10.1117/12.2012516

KEYWORDS: Probability theory, Logic, Logic devices, Reliability, Multiplexers, Magnetorheological finishing, Statistical modeling, Tolerancing, Instrument modeling, MATLAB

Read Abstract +

The miniaturization of the devices into nanoscale has enabled ultra high density chips, but at the cost of increased defect density. In this manuscript, Markov Random Field (MRF) approach is used to evaluate the device reliability in the presence of high defect density. Both hard and soft errors have been considered. We have presented a NANOLAB based fault model of 8-bit full adder, basic building block being 2:1 multiplexer. At each level, a Triple Modular Redundancy (TMR) is employed to enhance reliability. The results are compared with another 8-bit full adder, designed using logic gates. Assuming defect rate up to 10%, the circuits are evaluated for stuck at faults. Further, we have augmented the NANOLAB tool to include a design library of various types of flip flops. A 4-bit SISO right shift register is used as vehicle for exemplifying our approach. The fault tolerant approach N-Modular Redundancy (NMR) is compared at different levels of granularity and for varying levels of N. It is observed that NMR fails to provide the device fault tolerance when defect rate is higher than a threshold value.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years