KEYWORDS: Data acquisition, Solar cells, Solar energy, Reliability, Photovoltaics, Analytical research, Sensors, Silicon solar cells, Temperature metrology, Humidity
The Tucson Electric Power (TEP)/University of Arizona AzRISE (Arizona Research Institute for Solar Energy) solar test yard is continuing efforts to improve standardization and data acquisition reliability throughout the facility. Data reliability is ensured through temperature-insensitive data acquisition devices with battery backups in the upgraded test yard. Software improvements allow for real-time analysis of collected data, while uploading to a web server. Sample data illustrates high fidelity monitoring of the burn-in period of a polycrystalline silicon photovoltaic module test string with no data failures over 365 days of data collection. In addition to improved DAQ systems, precision temperature monitoring has been implemented so that PV module backside temperatures are routinely obtained. Weather station data acquired at the test yard provides local ambient temperature, humidity, wind speed, and irradiance measurements that have been utilized to enable characterization of PV module performance over an extended test period
Electroluminescence imaging can be used as a non-invasive method to spatially assess performance degradation in photovoltaic (PV) modules. Cells, or regions of cells, that do not produce an infra-red luminescence signal under electrical excitation indicate potential damage in the module. In this study, an Andor iKon-M camera and an image acquisition tool provided by Andor have been utilized to obtain electroluminescent images of a full-sized multicrystalline PV module at regular intervals throughout an accelerated lifecycle test (ALC) performed in a large-scale environmental degradation chamber. Computer aided digital image analysis methods were then used to automate degradation assessment in the modules. Initial preprocessing of the images was designed to remove both background noise and barrel distortion in the image data. Image areas were then mapped so that changes in luminescent intensity across both individual cells and the full module could be identified. Two primary techniques for image analysis were subsequently investigated. In the first case, pixel intensity distributions were evaluated over each individual PV cell and changes to the intensities of the cells over the course of an ALC test were evaluated. In the second approach, intensity line scans of each of the cells in a PV module were performed and variations in line scan data were identified during the module ALC test. In this report, both the image acquisition and preprocessing technique and the contribution of each image analysis approach to an assessment of degradation behavior will be discussed.
KEYWORDS: Solar cells, Thin films, Thin film solar cells, Photovoltaics, Analytical research, Solar energy, Crystals, Energy efficiency, Humidity, Control systems
Thin-film solar cells normally have the shortest energy payback time due to their simpler mass-production process compared to polycrystalline-Si photovoltaic (PV) modules, despite the fact that crystalline-Si-based technology typically has a longer total lifetime and a higher initial power conversion efficiency. For both types of modules, significant aging occurs during the first two years of usage with slower long-term aging over the module lifetime. The PV lifetime and the return-on-investment for local PV system installations rely on long-term device performance. Understanding the efficiency degradation behavior under a given set of environmental conditions is, therefore, a primary goal for experimental research and economic analysis. In the present work, in-situ measurements of key electrical characteristics (J, V, Pmax, etc.) in polycrystalline-Si and CdTe thin-film PV modules have been analyzed. The modules were subjected to identical environmental conditions, representative of southern Arizona, in a full-scale, industrial-standard, environmental degradation chamber, equipped with a single-sun irradiance source, temperature, and humidity controls, and operating an accelerated lifecycle test (ALT) sequence. Initial results highlight differences in module performance with environmental conditions, including temperature de-rating effects, for the two technologies. Notably, the thin-film CdTe PV module was shown to be approximately 15% less sensitive to ambient temperature variation. After exposure to a seven-month equivalent compressed night-day weather cycling regimen the efficiency degradation rates of both PV technology types were obtained and will be discussed.
KEYWORDS: Temperature metrology, Solar cells, Photovoltaics, Environmental sensing, Measurement devices, Sensors, Thermal energy technology, Temperature sensors, Energy conversion efficiency, Resistance
It is well known that the efficiency of a photovoltaic (PV) module is strongly impacted by its temperature such that higher temperatures lead to lower energy conversion efficiencies. An accurate measurement of the temperature de-rating effect, therefore, is vital to the correct interpretation of PV module performance under varied environmental conditions. The current work investigates and compares methods for performing measurements of module temperature both in the lab and in field-test environments. A comparison of several temperature measurement devices was made in order to establish the ideal sensor configuration for quantifying module operating temperature. Sensors were also placed in various locations along a string of up to eight photovoltaic modules to examine the variance in operating temperature with position in the string and within a larger array of strings.
Polycrystalline silicon photovoltaic (PV) modules have the advantage of lower manufacturing cost as compared to their monocrystalline counterparts, but generally exhibit both lower initial module efficiencies and more significant early-stage efficiency degradation than do similar monocrystalline PV modules. For both technologies, noticeable deterioration in power conversion efficiency typically occurs over the first two years of usage. Estimating PV lifetime by examining the performance degradation behavior under given environmental conditions is, therefore, one of continual goals for experimental research and economic analysis.
In the present work, accelerated lifecycle testing (ALT) on three polycrystalline PV technologies was performed in a full-scale, industrial-standard environmental chamber equipped with single-sun irradiance capability, providing an illumination uniformity of 98% over a 2 x 1.6m area. In order to investigate environmental aging effects, timedependent PV performance (I-V characteristic) was evaluated over a recurring, compressed day-night cycle, which simulated local daily solar insolation for the southwestern United States, followed by dark (night) periods. During a total test time of just under 4 months that corresponded to a year equivalent exposure on a fielded module, the temperature and humidity varied in ranges from 3°C to 40°C and 5% to 85% based on annual weather profiles for Tucson, AZ. Removing the temperature de-rating effect that was clearly seen in the data enabled the computation of normalized efficiency degradation with time and environmental exposure. Results confirm the impact of environmental conditions on the module long-term performance. Overall, more than 2% efficiency degradation in the first year of usage was observed for all thee polycrystalline Si solar modules. The average 5-year degradation of each PV technology was estimated based on their determined degradation rates.
KEYWORDS: Photovoltaics, Data backup, Solar energy, Reliability, Solar cells, Data acquisition, Temperature metrology, Data storage, Environmental sensing, Resistors
The University of Arizona AzRISE (Arizona Research Institute for Solar Energy) and Tucson Electric Power solar test yard is currently undergoing renovations to upgrade and standardize the data acquisition capabilities throughout the yard. Test yard improvements have enabled increased data collection reliability through state-of-the-art and environmentallyrobust data logging and real-time analysis. Enhanced capabilities include 10 msec max. data resolution, precision PV backside temperature monitoring of both individual and strings of modules, measurement of both AC and DC outputs as well as GHI and POA irradiance, active data backup to eliminate data intermittency, and robust Ethernet connectivity for data collection. An on-site weather station, provides wind speed and direction, relative humidity, and air temperature data. The information collected is accessed remotely via web server and includes raw performance and environmental conditions as well as extracted figures of performance for systems under test. Complementing the UA’s existing accelerated environmental-testing chamber, the new test yard acquisition capabilities have enabled high fidelity system and sub-system-level operational testing under a range of field-level test conditions. The combined facilities, thus, provide a full-spectrum testing resource for photovoltaic performance and degradation analysis. Specific measurement characteristics and sample data collected from a polysilicon module test string are utilized to illustrate test yard capabilities.
Lifecycle degradation testing of photovoltaic (PV) modules in accelerated-degradation chambers can enable the prediction both of PV performance lifetimes and of return-on-investment for installations of PV systems. With degradation results strongly dependent on chamber test parameters, the validity of such studies relative to fielded, installed PV systems must be determined. In the present work, accelerated aging of a 250 W polycrystalline silicon module is compared to real-time performance degradation in a similar polycrystalline-silicon, fielded, PV technology that has been operating since October 2013. Investigation of environmental aging effects are performed in a full-scale, industrial-standard environmental chamber equipped with single-sun irradiance capability providing illumination uniformity of 98% over a 2 x 1.6 m area. Time-dependent, photovoltaic performance (J-V) is evaluated over a recurring, compressed night-day cycle providing representative local daily solar insolation for the southwestern United States, followed by dark (night) cycling. This cycle is synchronized with thermal and humidity environmental variations that are designed to mimic, as closely as possible, test-yard conditions specific to a 12 month weather profile for a fielded system in Tucson, AZ. Results confirm the impact of environmental conditions on the module long-term performance. While the effects of temperature de-rating can be clearly seen in the data, removal of these effects enables the clear interpretation of module efficiency degradation with time and environmental exposure. With the temperature-dependent effect removed, the normalized efficiency is computed and compared to performance results from another panel of similar technology that has previously experienced identical climate changes in the test yard. Analysis of relative PV module efficiency degradation for the chamber-tested system shows good comparison to the field-tested system with ~2.5% degradation following an equivalent year of testing.
KEYWORDS: Solar cells, Humidity, Silicon, Solar energy, Photovoltaics, Lamps, Temperature metrology, Environmental sensing, Manufacturing, Energy conversion efficiency
Lifecycle testing of full-scale photovoltaic (PV) modules was conducted in a large-sized, accelerated-degradation chamber in our labs that enables full-solar-spectrum irradiance, temperature, and humidity control. In-situ measurement of both polycrystalline and monocrystalline silicon PV module energy conversion characteristics were examined under environmental lifecycle conditions representative of Tucson, AZ. Specifically, the performance degradation of a Hanwha 295 W polycrystalline PV module and of a SunPower 320 W monocrystalline PV module were evaluated and compared. Results indicate that the initial efficiency of the polycrystalline module and the subsequent annual degradation occurred within expected ranges for that system. In contrast, the single-crystal module exhibited both a significant decrease in PV module efficiency during the test cycle, and early evidence of environmentally-induced materials degradation across the module. The temperature and time-dependence of PV module behavior were extracted to provide insight into early-stage performance degradation under conditions approximating field-relevant environments.
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