Prof. Thomas N. Jackson Profile

Prof. Thomas N. Jackson

at Pennyslvania State Univ

SPIE Involvement:

Author

Publications (32)

Proceedings Article | 5 October 2023 Poster + Paper

Poster + Paper

Thin-film PZT actuator performance in adjustable x-ray optic segments

Kenneth Buffo, Casey DeRoo, Paul Reid, Vladimir Kradinov, Vanessa Marquez, Susan Trolier-McKinstry, Nathan Bishop, Thomas Jackson, Quyen Tran, Hanyuan Liang, Tianning Liu, Mohit Tendulkar

Proceedings Volume 12679, 1267915 (2023) https://doi.org/10.1117/12.2675949

KEYWORDS: Mirrors, Iterated function systems, Actuators, X-ray optics, Finite element methods, X-rays, Ferroelectric materials, Thin films, Piezoelectric thin film actuators, Electrodes

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SPIE Journal Paper | 2 June 2022

Stress-balancing in piezoelectric adjustable x-ray optics

Nathan Bishop, Vladimir Kradinov, Paul Reid, Thomas Jackson, Casey DeRoo, Susan Trolier-McKinstry

JATIS, Vol. 8, Issue 02, 029004, (June 2022) https://doi.org/10.1117/12.10.1117/1.JATIS.8.2.029004

KEYWORDS: Mirrors, Actuators, X-ray optics, X-rays, Thin films, Glasses, Iridium, Coating, Prototyping, Sputter deposition

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Proceedings Article | 23 August 2021 Presentation + Paper

Presentation + Paper

Process development for adjustable X-ray mirrors

Mohit Tendulkar, Tianning Liu, Nicole Kirchner-Hall, Nathan Bishop, Quyen Tran, Casey DeRoo, Vincenzo Cotroneo, Vladimir Kradinov, Vanessa Marquez, Paul Reid, Susan Trolier-McKinstry, Thomas Jackson

Proceedings Volume 11822, 1182213 (2021) https://doi.org/10.1117/12.2595316

KEYWORDS: Active optics, Thin film devices, Piezoelectric thin film actuators, X-ray optics, Mirrors, X-rays, Actuators, Ferroelectric materials, Zinc oxide, Lithography

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Proceedings Article | 5 August 2021 Presentation

Presentation

Optical metrology of an adjustable x-ray mirror prototype

Casey DeRoo, Paul Reid, Vanessa Marquez, Vladimir Kradinov, Susan Trolier-McKinstry, Nathan Bishop, Thomas Jackson, Mohit Tendulkar, Quyen Tran

Proceedings Volume 11822, 118220Z (2021) https://doi.org/10.1117/12.2594726

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Proceedings Article | 1 August 2021 Presentation

Presentation

Strain gauging for on-orbit figure monitoring of adjustable X-ray optics: systems analyses

Paul Reid, Vladimir Kradinov, Mark Freeman, Nathan Bishop, Casey DeRoo, Thomas Jackson, Vanessa Marquez, Mohit Tendulkar, Quyen Tran, Susan Trolier-McKinstry

Proceedings Volume 11822, 1182214 (2021) https://doi.org/10.1117/12.2595160

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SPIE Journal Paper | 23 March 2019 Open Access

Open Access

Thickness distribution of sputtered films on curved substrates for adjustable x-ray optics

Nathan Bishop, Julian Walker, Casey DeRoo, Tianning Liu, Mohit Tendulkar, Vincenzo Cotroneo, Edward Hertz, Vladimir Kradinov, Eric Schwartz, Paul Reid, Thomas Jackson, Susan Trolier-McKinstry

JATIS, Vol. 5, Issue 02, 021005, (March 2019) https://doi.org/10.1117/12.10.1117/1.JATIS.5.2.021005

KEYWORDS: Mirrors, X-ray optics, Sputter deposition, Finite element methods, Glasses, Ferroelectric materials, X-rays, Actuators, Prototyping, Mathematical modeling

Read Abstract +

Piezoelectric adjustable x-ray optics use magnetron sputtered thin film coatings on both sides of a thin curved glass substrate. To produce an optic suitable for a mission requiring high-angular resolution like “Lynx,” the integrated stresses (stress×thickness) of films on both sides of the optic must be approximately equal. Thus, understanding how sputtered film thickness distributions change for convex and concave curved substrates is necessary. To address this, thickness distributions of piezoelectric Pb0.995(Zr0.52Ti0.48)0.99Nb0.01O3 films are studied on flat, convex, and concave cylindrical substrates with a 220-mm radius of curvature. A mathematical model of the film thickness distribution is derived based on the geometric properties of the sputter tool and the substrate, and film thicknesses deposited with a commercially available sputtering tool are measured with spectroscopic ellipsometry. Experiment and modeled results for flat and convex curved substrates demonstrate good agreement, with average relative thickness distribution difference of 0.19% and −0.10% respectively, and a higher average difference of 1.4% for concave substrates. The calculated relative thickness distributions are applied to the convex and concave sides of a finite-element analysis (FEA) model of an adjustable x-ray optic prototype. The FEA model shows that, left uncorrected, the relative film thickness variation will yield an optic with an optical performance of 2.6 arc sec half power diameter (HPD) at 1 keV. However, the mirror figure can be corrected to diffraction-limited performance (0.3 arc sec HPD) using the piezoelectric adjusters, suggesting that the tolerances for applying a balanced integrated stress on both sides of a mirror are alleviated for adjustable x-ray optics as compared to traditional static x-ray mirrors. Furthermore, the piezoelectric adjusters will also allow changes in mirror figure over the telescope lifetime due to drift in the stress states of the x-ray surfaces to be corrected on orbit.

Proceedings Article | 26 October 2018 Presentation + Paper

Presentation + Paper

Progress in development of adjustable optics for x-ray astronomy

Vincenzo Cotroneo, Casey DeRoo, Thomas Jackson, Vladimir Kradinov, Tianning Liu, Vanessa Marquez, Paul Reid, Daniel Schwartz, Eric Schwartz, Mohit Tendulkar, Susan Trolier-McKinstry, Julian Walker

Proceedings Volume 10761, 1076109 (2018) https://doi.org/10.1117/12.2323283

KEYWORDS: Mirrors, Optics manufacturing, Ferroelectric materials, X-ray optics, Glasses, Prototyping, X-ray telescopes, Actuators, Crystals, Electronics

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SPIE Journal Paper | 19 March 2018

Deterministic figure correction of piezoelectrically adjustable slumped glass optics

Casey DeRoo, Ryan Allured, Vincenzo Cotroneo, Edward Hertz, Vanessa Marquez, Paul Reid, Eric Schwartz, Alexey Vikhlinin, Susan Trolier-McKinstry, Julian Walker, Thomas Jackson, Tianning Liu, Mohit Tendulkar

JATIS, Vol. 4, Issue 01, 019004, (March 2018) https://doi.org/10.1117/12.10.1117/1.JATIS.4.1.019004

KEYWORDS: Mirrors, Iterated function systems, X-ray optics, Metrology, Glasses, Composites, Optics manufacturing, Finite element methods, Ferroelectric materials, X-rays

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Proceedings Article | 19 September 2017 Presentation + Paper

Presentation + Paper

Lynx Mission concept status

Jessica Gaskin, Ryan Allured, Simon Bandler, Stefano Basso, Marshall Bautz, Michael Baysinger, Michael Biskach, Tyrone Boswell, Peter Capizzo, Kai-Wing Chan, Marta Civitani, Lester Cohen, Vincenzo Cotroneo, Jacqueline Davis, Casey DeRoo, Michael DiPirro, Alexandra Dominguez, Leo Fabisinski, Abraham Falcone, Enectali Figueroa-Feliciano, Jay Garcia, Karen Gelmis, Ralf Heilmann, Randall Hopkins, Thomas Jackson, Kiranmayee Kilaru, Ralph Kraft, Tianning Liu, Ryan McClelland, Randy McEntaffer, Kevin McCarley, John Mulqueen, Feryal Özel, Giovanni Pareschi, Paul Reid, Raul Riveros, Mitchell Rodriguez, Justin Rowe, Timo Saha, Mark Schattenburg, Andrew Schnell, Daniel Schwartz, Peter Solly, Robert Suggs, Steven Sutherlin, Douglas Swartz, Susan Trolier-McKinstry, James Tutt, Alexey Vikhlinin, Julian Walker, Wonsik Yoon, William Zhang

Proceedings Volume 10397, 103970S (2017) https://doi.org/10.1117/12.2273911

KEYWORDS: X-rays, Astrophysics, Galactic astronomy, Environmental sensing, Stars, Planetary systems, X-ray optics, Observatories

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Proceedings Article | 29 August 2017 Presentation + Paper

Presentation + Paper

Design and fabrication of adjustable x-ray optics using piezoelectric thin films

J. Walker, T. Liu, M. Tendulkar, D. Burrows, C. DeRoo, R. Allured, E. Hertz, V. Cotroneo, P. Reid, E. Schwartz, T. Jackson, S. Trolier-McKinstry

Proceedings Volume 10399, 103991K (2017) https://doi.org/10.1117/12.2275351

KEYWORDS: Mirrors, Thin films, X-ray optics, Glasses, Ferroelectric materials, X-rays, Electrodes, Modulation, Coating, Radio optics

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Proceedings Article | 29 August 2017 Presentation + Paper

Presentation + Paper

Deterministic figure correction of piezoelectrically adjustable slumped glass optics

Casey DeRoo, Ryan Allured, Vincenzo Cotroneo, Edward Hertz, Vanessa Marquez, Paul Reid, Eric Schwartz, Alexey Vikhlinin, Susan Trolier-McKinstry, Julian Walker, Thomas Jackson, Tianning Liu, Mohit Tendulkar

Proceedings Volume 10399, 103991M (2017) https://doi.org/10.1117/12.2275210

KEYWORDS: X-ray optics, Glasses, X-rays, Mirrors, Thin films, Actuators, Thermography, Optical fabrication, Metrology, Testing and analysis

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Proceedings Article | 25 August 2017 Paper

Paper

Kirigami-based three-dimensional OLED concepts for architectural lighting

Taehwan Kim, Jared Price, Alex Grede, Sora Lee, Thomas Jackson, Noel Giebink

Proceedings Volume 10362, 1036220 (2017) https://doi.org/10.1117/12.2274154

KEYWORDS: Organic light emitting diodes, OLED lighting, Light sources and illumination, Solid state lighting, Manufacturing, LED lighting, Light emitting diodes, 3D displays

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Proceedings Article | 27 October 2016 Paper

Paper

Toward large-area sub-arcsecond x-ray telescopes II

Stephen O'Dell, Ryan Allured, Andrew Ames, Michael Biskach, David Broadway, Ricardo Bruni, David Burrows, Jian Cao, Brandon Chalifoux, Kai-Wing Chan, Yip-Wah Chung, Vincenzo Cotroneo, Ronald Elsner, Jessica Gaskin, Mikhail Gubarev, Ralf Heilmann, Edward Hertz, Thomas Jackson, Kiranmayee Kilaru, Jeffrey Kolodziejczak, Ryan McClelland, Brian Ramsey, Paul Reid, Raul Riveros, Jacqueline Roche, Suzanne Romaine, Timo Saha, Mark Schattenburg, Daniel Schwartz, Eric Schwartz, Peter Solly, Susan Trolier-McKinstry, Melville Ulmer, Alexey Vikhlinin, Margeaux Wallace, Xiaoli Wang, David Windt, Youwei Yao, Shi Ye, William Zhang, Heng Zuo

Proceedings Volume 9965, 996507 (2016) https://doi.org/10.1117/12.2238247

KEYWORDS: X-ray telescopes, Mirrors, Coating, X-ray optics, Silicon, Ion implantation, X-rays, Thin films, Ions, Iridium

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SPIE Journal Paper | 4 March 2015

High temperature coefficient of resistance molybdenum oxide and nickel oxide thin films for microbolometer applications

Yao O. Jin, David Saint-John, Nikolas Podraza, Thomas Jackson, Mark Horn

OE, Vol. 54, Issue 03, 037101, (March 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.3.037101

KEYWORDS: Thin films, Oxygen, Oxides, Nickel, Ion beams, Molybdenum, Argon, Resistance, Thin film deposition, Microbolometers

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Proceedings Article | 17 September 2014 Paper

Paper

Technology requirements for a square meter, arcsecond resolution telescope for x-rays: the SMART-X mission

Daniel Schwartz, Ryan Allured, Jay Bookbinder, Vincenzo Cotroneo, William Forman, Mark Freeman, Stuart McMuldroch, Paul Reid, Harvey Tananbaum, Alexey Vikhlinin, Raegan Johnson-Wilke, Susan Trolier-McKinstry, Rudeger H. Wilke, Thomas Jackson, J. Israel Ramirez, Mikhail Gubarev, Jeffery Kolodziejczak, Stephen O'Dell, Brian Ramsey

Proceedings Volume 9208, 920806 (2014) https://doi.org/10.1117/12.2063469

KEYWORDS: Mirrors, X-rays, X-ray telescopes, X-ray technology, Observatories, Glasses, X-ray optics, Space telescopes, Space operations, Telecommunications

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Proceedings Article | 5 September 2014 Paper

Paper

ZnO thin film transistors and electronic connections for adjustable x-ray mirrors: SMART-X telescope

R. Johnson-Wilke, R. H. Wilke, M. Wallace, J. Ramirez, Z. Prieskorn, J. Nikoleyczik, V. Cotroneo, R. Allured, D. Schwartz, S. McMuldroch, P. Reid, D. Burrows, T. Jackson, S. Trolier-McKinstry

Proceedings Volume 9208, 920809 (2014) https://doi.org/10.1117/12.2063369

KEYWORDS: Ferroelectric materials, Zinc oxide, Transistors, Mirrors, Thin films, Glasses, LabVIEW, Electrodes, X-ray telescopes, Telescopes

Read Abstract +

Proceedings Article | 24 June 2014 Paper

Paper

Evaluation of 1/f noise in prospective IR imaging thin films

Hitesh Basantani, David Saint John, Nikolas Podraza, Thomas Jackson, Mark Horn

Proceedings Volume 9070, 90701P (2014) https://doi.org/10.1117/12.2054652

KEYWORDS: Thin films, Crystals, Germanium, Thin film deposition, Infrared imaging, Plasma enhanced chemical vapor deposition, Silicon, Vanadium, Oxides, Silicon films

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Proceedings Article | 24 June 2014 Paper

Paper

Nickel oxide and molybdenum oxide thin films for infrared imaging prepared by biased target ion-beam deposition

Yao Jin, David Saint John, Tom Jackson, Mark Horn

Proceedings Volume 9070, 90701S (2014) https://doi.org/10.1117/12.2053174

KEYWORDS: Thin films, Oxides, Oxygen, Nickel, Molybdenum, Thin film deposition, Refractive index, Argon, Absorption, Ions

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Proceedings Article | 18 June 2013 Paper

Paper

High-resistivity and high-TCR vanadium oxide thin films for infrared imaging prepared by bias target ion-beam deposition

Yao Jin, Hitesh Basantani, Adem Ozcelik, Tom Jackson, Mark Horn

Proceedings Volume 8704, 87043C (2013) https://doi.org/10.1117/12.2016277

KEYWORDS: Thin films, Molybdenum, Vanadium, Ion beams, Sputter deposition, Ions, Oxides, Oxygen, Thin film deposition, Infrared imaging

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Proceedings Article | 21 May 2011 Paper

Paper

Microstructure of vanadium oxide used in microbolometers

B. Gauntt, J. Li, O. Cabarcos, H. Basantani, C. Venkatasubramanian, S. S. Bharadwaja, N. Podraza, T. Jackson, D. Allara, S. Antrazi, M. Horn, E. Dickey

Proceedings Volume 8012, 80123T (2011) https://doi.org/10.1117/12.884161

KEYWORDS: Vanadium, Ion beams, Oxides, Microbolometers, Thin films, Diffraction, Transmission electron microscopy, Nanocomposites, Oxygen, Sputter deposition

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Proceedings Article | 21 May 2011 Paper

Paper

Thin film silicon and germanium for uncooled microbolometer applications

D. Saint John, H.-B. Shin, M.-Y. Lee, E. Dickey, N. Podraza, T. Jackson

Proceedings Volume 8012, 80123U (2011) https://doi.org/10.1117/12.884269

KEYWORDS: Plasma enhanced chemical vapor deposition, Silicon films, Microcrystalline materials, Thin films, Germanium, Silicon, Microbolometers, Spectroscopic ellipsometry, Carbon, Hydrogen

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Proceedings Article | 21 May 2011 Paper

Paper

New materials for uncooled IR imaging: nickel manganite thin films grown by spin spray

Song Won Ko, Jing Li, Myung-Yoon Lee, Elizabeth Dickey, Thomas Jackson, Susan Trollier-McKinstry

Proceedings Volume 8012, 80123S (2011) https://doi.org/10.1117/12.884636

KEYWORDS: Nickel, Copper, Transmission electron microscopy, Spinel, Silicon, Microbolometers, Resistance, Infrared imaging, Thin film growth, Thin films

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Proceedings Article | 22 May 2006 Paper

Paper

All-organic active matrix OLED flexible display

Lisong Zhou, Alfred Wanga, Sheng-Chu Wu, Jie Sun, Sungkyu Park, Shelby Nelson, Diane Freeman, Yongtaek Hong, Thomas Jackson

Proceedings Volume 6225, 62250E (2006) https://doi.org/10.1117/12.666613

KEYWORDS: Organic light emitting diodes, Positron emission tomography, Glasses, Thin films, Dielectrics, Polymers, Capacitors, Optical lithography, Flexible displays, Transistors

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Proceedings Article | 18 October 2004 Paper

Paper

Design of an auto-zeroed differential organic thin film field-effect transistor amplifier for sensor applications

David Binkley, Nikhil Verma, Robert Crawford, Erik Brandon, Thomas Jackson

Proceedings Volume 5522, (2004) https://doi.org/10.1117/12.559934

KEYWORDS: Amplifiers, Sensors, Switches, Field effect transistors, Analog electronics, Capacitors, Transistors, Thin films, Signal processing, Digital electronics

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Proceedings Article | 28 August 2002 Paper

Paper

Enabling technologies for plastic displays

James Sturm, Helena Gleskova, Thomas Jackson, Stephen Fonash, Sigurd Wagner

Proceedings Volume 4712, (2002) https://doi.org/10.1117/12.480927

KEYWORDS: Transistors, Organic semiconductors, Silicon, Amorphous silicon, Printing, Polymers, Thin films, Optical lithography, Electrodes, Manufacturing

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Proceedings Article | 21 December 2001 Paper

Paper

Photoemission characterization of interfaces between Au and pentacene

Neil Watkins, Quoc Le, Serkan Zorba, Li Yan, Yongli Gao, Shelby Nelson, Chung-Chen Kuo, Thomas Jackson

Proceedings Volume 4466, (2001) https://doi.org/10.1117/12.451472

KEYWORDS: Gold, Interfaces, Electrons, Chemical reactions, Ultraviolet radiation, Ionization, Chemical species, Metals, Thin films, Transistors

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Proceedings Article | 21 December 2001 Paper

Paper

Improved organic thin film transistor performance using chemically modified gate dielectrics

David Gundlach, Chung-Chen Kuo, Chris Sheraw, Jonathan Nichols, Thomas Jackson

Proceedings Volume 4466, (2001) https://doi.org/10.1117/12.451466

KEYWORDS: Dielectrics, Silicon, Silica, Silicon films, Thin films, Organic semiconductors, Transistors, Electronics, Atomic force microscopy, Polymers

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Proceedings Article | 2 October 2001 Paper

Paper

Reliable integration of piezoelectric lead zirconate titanate with MEMS fabrication processes

Steven Gross, Qingqi Zhang, Srinivas Tadigadapa, Susan Trolier-McKinstry, Thomas Jackson, Frank Djuth

Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442988

KEYWORDS: Etching, Ferroelectric materials, Silicon, Microelectromechanical systems, Platinum, Zirconium dioxide, Ion beams, Dielectric polarization, Wet etching, Ions

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Proceedings Article | 7 September 2001 Paper

Paper

Flexible display enabling technology

Sigurd Wagner, Stephen Fonash, Thomas Jackson, James Sturm

Proceedings Volume 4362, (2001) https://doi.org/10.1117/12.439119

KEYWORDS: Polymers, Transistors, Thin films, Silicon, Printing, Glasses, Organic light emitting diodes, Silicon films, Optical lithography, Flexible displays

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Proceedings Article | 13 December 2000 Paper

Paper

Imaging microwell detectors for x-ray and gamma-ray applications

J. Kevin Black, Phil Deines-Jones, Stanley Hunter, Keith Jahoda, J. Huang, Thomas Jackson, H. Klauk, W. Qian

Proceedings Volume 4140, (2000) https://doi.org/10.1117/12.409126

KEYWORDS: Sensors, X-ray imaging, X-rays, Image sensors, X-ray detectors, Electrodes, Gamma radiation, Metals, Platinum, Dielectrics

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Proceedings Article | 1 July 1997 Paper

Paper

Device technology for lightweight panoramic displays

Stephen Fonash, Osama Awadelkarim, John Crowley, Thomas Jackson, Antoine Kahn, James Sturm, Sigurd Wagner

Proceedings Volume 3057, (1997) https://doi.org/10.1117/12.276983

KEYWORDS: Metals, Amorphous silicon, Organic light emitting diodes, Panoramic photography, Glasses, Light valves, Reflectivity, Opacity, Dielectrics, Crystals

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Proceedings Article | 1 July 1997 Paper

Paper

Industry/university teaming for display research

John Crowley, Osama Awadelkarim, Stephen Fonash, Thomas Jackson, Antoine Kahn, Terry Peterson, James Sturm, Sigurd Wagner

Proceedings Volume 3057, (1997) https://doi.org/10.1117/12.277004

KEYWORDS: Manufacturing, Thin films, Semiconductors, Analytical research, Laser crystals, Electronics, LCDs, Dielectrics, Defense and security, Interfaces

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Showing 5 of 32 publications

Conference Committee Involvement (3)

Organic Field-Effect Transistors VI

26 August 2007 | San Diego, California, United States

Organic Field-Effect Transistors IV

31 July 2005 | San Diego, California, United States

Organic Field Effect Transistors III

3 August 2004 | Denver, Colorado, United States

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