Dr. Timothy Kehoe
Optical Engineer at IRIS Ireland
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 March 2009 Paper
Proceedings Volume 7271, 72711V (2009) https://doi.org/10.1117/12.814162
KEYWORDS: Polymers, Polymer thin films, Photoacoustic spectroscopy, Interfaces, Acoustics, Nanoimprint lithography, Silicon, Polymethylmethacrylate, Metrology, Head-mounted displays

Proceedings Article | 20 March 2008 Paper
Proceedings Volume 6921, 69210F (2008) https://doi.org/10.1117/12.772545
KEYWORDS: Diffraction, Diffraction gratings, Polymers, Photoacoustic spectroscopy, Silicon, Nanoimprint lithography, Polymethylmethacrylate, Metrology, Aluminum, Semiconducting wafers

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