Prof. Tomohiko Ohtsuka Profile

Prof. Tomohiko Ohtsuka

at Tokyo National College of Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 1 May 2022 Paper

Takeru Yamanaka, Akira Kitsuda, Tomohiko Ohtsuka

Proceedings Volume 12177, 1217732 (2022) https://doi.org/10.1117/12.2624197

KEYWORDS: Inspection, Binary data, Ridge detection, Parallel processing, Logic, Image restoration, Databases

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Keywords/Phrases