Dr. Toshiyuki Takatsuji
at AIST
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 17 July 2015 Paper
Makoto Abe, Hiroyuki Fujimoto, Osamu Sato, Katsutoshi Sato, Toshiyuki Takatsuji
Proceedings Volume 9524, 95241M (2015) https://doi.org/10.1117/12.2189513
KEYWORDS: X-rays, X-ray computed tomography, Tungsten, X-ray imaging, 3D image reconstruction, 3D image processing, Prototyping, Signal attenuation, Imaging systems, Sensors

Proceedings Article | 14 September 2011 Paper
Proceedings Volume 8133, 81330T (2011) https://doi.org/10.1117/12.892385
KEYWORDS: Mirrors, Interferometers, Autocollimators, Laser stabilization, Sensors, Laser systems engineering, Motion measurement, Beam splitters, Receivers, Lasers

Proceedings Article | 29 August 2008 Open Access Paper
Proceedings Volume 7066, 706602 (2008) https://doi.org/10.1117/12.797968
KEYWORDS: Standards development, Manufacturing, Calibration, Tin, 3D imaging standards, Metrology, Coating, 3D metrology, Chromium, Reflectivity

Proceedings Article | 14 August 2006 Paper
Proceedings Volume 6292, 62920Q (2006) https://doi.org/10.1117/12.679314
KEYWORDS: Interferometry, Ferroelectric materials, Phase shifts, Wavelength tuning, Phase measurement, Phase interferometry, Fizeau interferometers, Beam splitters, Profiling, Silica

Proceedings Article | 19 August 2005 Paper
Toshiyuki Takatsuji, Koshi Kondo, Aizo Kubo, Frank Haertig, Sonko Osawa, Kazuya Naoi, Tomizo Kurosawa, Masaharu Komori
Proceedings Volume 5879, 58790Q (2005) https://doi.org/10.1117/12.614851
KEYWORDS: Calibration, Metrology, Manufacturing, Glasses, Data acquisition

Showing 5 of 14 publications
Conference Committee Involvement (8)
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Showing 5 of 8 Conference Committees
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