Ying-Jun Lei
at Hefei Univ of Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 November 2021 Paper
Proceedings Volume 12059, 1205921 (2021) https://doi.org/10.1117/12.2617305
KEYWORDS: Distortion, Atomic force microscope, Atomic force microscopy, Scanning probe microscopes, Raster graphics, Scanning probe microscopy, Image quality, Sensors, Scanning tunneling microscopy, Scanning electron microscopy

Proceedings Article | 19 November 2021 Paper
Proceedings Volume 12059, 120591L (2021) https://doi.org/10.1117/12.2612275
KEYWORDS: Actuators, Structural design, Control systems, Sensors, Calibration, Standards development, Control systems design

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 110534R (2019) https://doi.org/10.1117/12.2517411
KEYWORDS: Sensors, Photodetectors, Calibration, Mirrors, Optical instrument design, Semiconductor lasers, Signal processing

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