Prof. Youchia Chang
at National Yang Ming Chiao Tung Univ.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 October 2023 Presentation + Paper
Proceedings Volume 12653, 126530H (2023) https://doi.org/10.1117/12.2685760
KEYWORDS: Critical dimension metrology, Optical proximity correction, Optical lithography, Nanostructures, Metalenses, Silicon nitride, Reticles

Proceedings Article | 3 October 2022 Poster
Proceedings Volume PC12195, PC1219521 (2022) https://doi.org/10.1117/12.2644847
KEYWORDS: Optical proximity correction, Lithography, Optical lithography, Near infrared, Photoresist materials, Critical dimension metrology, Systems modeling, Semiconductors, Photoresist developing, Photomasks

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